The Oxford Ultim® Max EDS Detector represents the next generation of Silicon Drift Detectors (SDD) designed for advanced X-ray analysis in the SEM. Ultimately, this detector combines the largest sensor sizes with Extreme electronics to deliver unparalleled speed and sensitivity. Hence, it is ideal for a wide range of applications.
Features of the Oxford Ultim® Max EDS Detector
Speed
- Extreme electronics with the X4 pulse processor allow Ultim® Max to map samples at count rates of 1,500,000 cps. Additionally, it also accurately quantifies composition at 400,000 cps.
Sensitivity
- The large 100 mm² and 170 mm² sensor areas of Ultim® Max deliver unparalleled count rates under the most demanding analytical conditions.
High-Quality Data Collection
- The large SDD sensors of Ultim® Max collect up to 17x more data in the same time with no loss of accuracy. Consequently, you can map larger areas, improve statistics in each data point, collect data much faster, or investigate the smallest nanostructures. Indeed, Ultim® Max provides the ultimate solution for X-ray analysis in the SEM.
The Oxford Ultim® Max EDS Detector offers exceptional performance and reliability for comprehensive elemental analysis. Furthermore, its advanced technology, combined with unparalleled speed and sensitivity, ensures precise and dependable results.
Quantitative analysis at >400,000CPS
Comparison of spectra collected at over 400,000CPS (yellow) and 4,000CPS (red) from an Orthoclase Standard Sample
Electron image of a spinner bowl sample showing contamination build up after EDS map acquisition of 1 minute and 17 minutes.
Composition of an Orthoclase Standard calculated from spectra collected at 400,000CPS and 4,000CPS.
At 1,500,000CPS, an X-ray map collected in as little as 5 seconds provides a detailed picture of the elemental make-up region of interest, with sufficient data for automatic phase analysis.
X-Ray maps collected from a mineral sample at 1,500,000CPS for 5 secs
