Features:
- Cross-section milling rate: 1 mm/hour!*1 – (*1=Si protrudes 100 um from the mask edge)
- Cross-section widths up to 8 mm
- Hybrid Model: Dual-Milling Configuration Available
The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy. Cryogenic versions of the ArBlade 5000 provide active cooling of the cross-section milling stage during sample processing. An integrated liquid nitrogen dewar connected to the cross-section stage effectively removes heat induced during ion-beam milling from the shielding mask and sample.
Specimen: lead for mechanical pencil, Milling time: 1.5 hours
Enlarged of the red frame Enlarged of the left image
Specimen: electronic component, Milling time: 5 hours
Image of Cross-section Milling
Image of Flat Milling