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HomeMicroscopyElectron MicroscopyTEM HITACHI HD-2700 Spherical Aberration Corrected STEM/SEM
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HITACHI HF-3300 FE TEM

HITACHI HD-2700 Spherical Aberration Corrected STEM/SEM

  • 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability
  • Bulk and surface structures of a specimen can be imaged simultaneously
  • With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging, with minimal user’s effort in doing aberration correction
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  • Description
Description

Features:

  • High-resolution STEM imaging
    – HAADF-STEM image 0.136 nm, FFT image 0.105 nm (optional HR lens)
    – BF STEM image 0.204 nm (w/o Cs-corrector)
  • High-speed & high-sensitivity EDX analysis: Probe current × 10 times
    – Timely and rapid elemental mapping
    – Low-concentration element detection
  • Hitachi-developed Cs-corrector
    – Equipped with a probe-forming spherical aberration corrector developed by Hitachi, the automatic aberration-correction process takes a short time and does not require prior experience for aberration correction
  • Seamless solution from sample preparation to observation & analysis
    – Holder compatible with Hitachi Focused Ion Beam (FIB)

Application

Cross Section BF-STEM Images of 32 nm NMOS Transistor
HD-2700 with aberration corrector
Acceleration Voltage : 200 kV

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Quasi-S Pte Ltd
(HQ)

35 Marsiling Industrial Estate Road 3 #04-03, Singapore 739257.

T (65) 6383 4386
F (65) 6383 3071
E contact@quasi-s.com.sg

Quasi-S Technology Sdn Bhd
(Bangi Branch)

Block Stroma B3-1, UKM-MTDC Smart Technology Centre 43600 Bangi, Selangor, Malaysia

T (603) 8920 2570
F (603) 8920 2506
E inquirybangi@quasi-s.com.my

Quasi-S Sdn Bhd
(Penang Branch)

15-G-26 Bayan Point Medan Kampung Relau 11900 Penang, Malaysia

T (604) 645 6973
F (60) 4645 6573
E inquiry@quasi-s.com.my

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