HITACHI SU7000 Ultra-High-Resolution Schottky SEM

Features:

• Versatile Imaging Capability
  – Fast acquisition of multiple signals to address expansive SEM needs, from imaging a wide field of view to visualizing sub-nanometer structures and everything in between
  – Newly designed electron optics and detection systems, allows for efficient simultaneous acquisition of multiple secondary electron and back-scattered electron signals
• Multi-Channel Imaging
  – Capable of processing, displaying, and saving up to 6 signals simultaneously to maximize information acquisition
• Wide Variety of Observation Techniques
  – Specimen chamber and the vacuum system are optimized for:
  ・Large specimen size
  ・Sample manipulation at various axes
  ・Variable pressure conditions
  ・Cryogenic conditions
  ・Heating and cooling in-situ observation
• Microanalysis
  – Schottky emitter electron gun, provides up to 200 nA beam current, for various microanalysis applications
  – Design to incorporate multiple analytical options including EDX, WDX, EBSD, cathodoluminescence, and more
• Enhanced Information Acquisition
• Acquisition of structural, topographical, compositional, crystallographic, and other types of information, by minimizing changes to microscope conditions, such as working distance or accelerating voltage
• Single-Scan Multi-Signal Imaging
• Simultaneous image acquisition for surface micro-structural information (UD), surface coating (MD), and overall topographic information (LD)
• Intuitive graphical user interface
• Enhance signal display
• Highly flexible screen layout
• Dual monitor
• Expandable observation and analysis
• Large specimen chamber and large stage
  – Optional Camera Navigation
  – Various detectors enabling dynamic observation
  – Detector selection under low vacuum conditions
  – Improved PD-BSED response speed