- Fast pulse processing from mapping and quantification
- Optimized data quality at all count rates
- High resolution quantitative analysis at mapping speeds greater than 400,000 output cps
- Highest throughput count rates on the market
The game changing advancements in the Octane Elite SDDs take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite EDS System also uses state of the art electronics, which yield high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.