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Nanotechnology Singapore | Laboratory Equipment | Quasi-S
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Particle Size Analysis (PSA)
Particle Size Analysis (PSA)
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Energy Dispersive X-ray Spectroscopy (EDS)
Energy Dispersive X-ray Spectroscopy (EDS)

Surface Profilometer

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Description

Description

Surface Profilometry is a non-destructive technique used to measure the surface topography, roughness, and texture of materials with high precision. Using contact or non-contact methods, a profilometer provides quantitative 2D and 3D surface measurements that are critical for quality control, process optimization, and materials research. This technique is suitable for metals, polymers, coatings, thin films, and a wide variety of industrial and research applications.

Applications

  • Surface Roughness Measurement: Quantify roughness parameters for quality control and process monitoring.
  • Topography Mapping: Generate 2D and 3D surface profiles for detailed surface characterization.
  • Thin Films & Coatings: Assess thickness uniformity, surface defects, and layer integrity.
  • Material Development: Evaluate surface modifications, treatments, and finishes.
  • Industrial Components: Inspect machined, polished, or treated surfaces for compliance with specifications.
  • Failure Analysis: Identify surface defects, scratches, wear, and corrosion features.
  • Process Optimization: Support manufacturing and finishing processes by providing accurate surface data.

 

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    Quasi-S Pte Ltd
    (HQ)

    35 Marsiling Industrial Estate Road 3 #04-03, Singapore 739257.

    T (65) 6383 4386
    F (65) 6383 3071
    E contact@quasi-s.com.sg

    Quasi-S Sdn Bhd
    (Bangi Branch)

    Block Stroma B3-1, UKM-MTDC Smart Technology Centre 43600 Bangi, Selangor, Malaysia

    T (603) 8210 1765
    F (603) 8920 2506
    E inquirybangi@quasi-s.com.my

    Quasi-S Sdn Bhd
    (Penang Branch)

    15-G-26 Bayan Point Medan Kampung Relau 11900 Penang, Malaysia

    T (604) 645 6973
    F (60) 4645 6573
    E inquiry@quasi-s.com.my

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