Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) is a high-resolution surface imaging technique that scans the sample surface with a sharp probe to generate topographical maps at the nanometer scale. AFM allows measurement of surface roughness, morphology, mechanical properties, and nanoscale features without extensive sample preparation. This makes it suitable for a wide range of applications in materials science, semiconductors, polymers etc.

Applications

• Surface Topography:Map surface structures of metals, polymers, semiconductors, and biomaterials in 3D.
• Mechanical Properties:Measure hardness, elasticity, adhesion, and friction at the nanoscale.
• Thin Film & Coatings:Assess surface roughness, uniformity, and layer integrity.
• Nanostructure Characterization:Analyze nanoparticles, nanowires, and other micro/nano structures.
• Materials Science:Study composites, ceramics, and polymer blends for surface features and defects.
• Quality & Failure Analysis:Detect surface defects, contamination, and irregularities in industrial components.