HITACHI SU1510 VP-SEM (Demo Unit)
HITACHI SU1510 VP-SEM is a compact benchtop Variable Pressure Scanning Electron Microscope designed for high-resolution imaging of non-conductive and hydrated samples. With a footprint of just 55 cm, it combines the advanced optics of the S-3400N and S-3700N series with a simplified interface and versatile vacuum modes.
Delivering 3 nm SE resolution in high vacuum and 4 nm BSE resolution in VP mode, the HITACHI SU1510 VP-SEM enables sharp surface morphology visualization without the need for conductive coating. This demo unit features a tungsten filament source, manual stage, and dual EDX ports (EDX system not included), making it a cost-effective solution for routine SEM workflows.
Its intuitive software interface and animated operational guides make it especially suitable for training labs, educational institutions, and industrial QA teams seeking reliable imaging with minimal setup complexity.
Key Features of HITACHI SU1510 VP-SEM
- 3 nm SE resolution (15 kV, high vacuum)
- 4 nm BSE resolution (VP mode)
- Accelerating voltage: 300 eV to 30 kV
- Variable pressure operation (<270 Pa)
- Tungsten filament source for stable beam performance
- Everhardt-Thornley SE detector and 4-segment BSE detector
- Quad-Bias function for enhanced signal-to-noise ratio
- Dual EDX ports with 35° take-off angle (EDX system not included)
- TMP vacuum system with rotary pump—no cooling water required
- Auto beam alignment functions (Auto Beam Setting, Auto Axial Alignment, Auto Brightness, Auto Stigma, Auto Focus)
- Animated operation and maintenance guides for simplified training
Stage & Sample Specifications
| Parameter | Specification |
|---|---|
| Stage Type | Manual mechanical stage |
| Sample Size (Max) | Up to 153 mm diameter, 60 mm height at EDX working distance |
| Movable Range | X, Y, Z axes (manual adjustment) |
| Chamber Size | Compact chamber suitable for small to medium samples |
| EDX Ports | Dual opposing ports, 35° take-off angle (EDX system not included) |
| Detectors | SE detector (Everhardt-Thornley), BSE detector (4-segment), optional ESED/IR |
Applications of HITACHI SU1510 VP-SEM
- Surface morphology and topography of non-conductive materials
- Failure analysis and quality control in industrial settings
- Biological imaging (non-living specimens)
- Educational and training environments in microscopy
The HITACHI SU1510 VP-SEM offers dependable imaging performance in a compact format, trusted by educators, lab technicians, and industrial users for routine SEM workflows. Its user-friendly design, variable pressure capability, and robust optics make it a practical choice for labs seeking reliable imaging without advanced analytical add-ons.
