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HITACHI SU3800/SU3900 SEM with advanced imaging capabilities
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HITACHI SU5000 Schottky FE-SEM with EM Wizard interface
HITACHI SU5000 Schottky FE-SEM

HITACHI SU3800/SU3900 SEM

Experience the HITACHI SU3800/SU3900 SEM, a state-of-the-art scanning electron microscope designed to deliver exceptional imaging and analysis capabilities.

  • Deliver both operability and expandability
  • User can automate many operations and efficiently utilize their high performance
  • Equipped with a large multipurpose specimen chamber to accommodate observation of large samples

This versatile and reliable SEM ensures precise and high-quality results, making it an invaluable tool for researchers and professionals alike.

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  • Description
Description

Experience the HITACHI SU3800/SU3900 SEM, a state-of-the-art scanning electron microscope designed to deliver exceptional imaging and analysis capabilities. With its advanced features and user-friendly interface, the SU3800/SU3900 SEM is ideal for a wide range of applications, from materials science to industrial inspection. This versatile and reliable SEM ensures precise and high-quality results, making it an invaluable tool for researchers and professionals alike.

Features of HITACHI SU3800/SU3900 SEM:

Larger specimen chamber
  • Robust stage for flexibility in sample size, shape & weight
  • Specimen protection by its exchange sequence
  • Increased viewing area with SEM MAP expanding sample navigation boundary
Improved automatic functions
  • Multiple operation modes for easy operation & flexibility
  • Automatic functions for various users via AFS, ABCC, AFC, ASC, IFT, Auto Focus
  • Optional Multi Zigzag enables wide area observation across multiple areas
Integrated solutions and detectors for various applications
  • High sensitivity detectors supporting all observation requirements, up to 20 ports
  • Optional SEM/EDS integration system, to allow full control by SEM graphic user interface
  • High sensitivity detectors, includes segmented BSED for composition & topography observation, optional UVD for CL observation, optional STEM holder for transmission image of thin samples
  • Optional software, includes Hitachi Map 3D and Image-Pro® for image processing, measurement, analysis, modelling

The Hitachi SU3800/SU3900 SEMt stands out as a premier choice for those seeking high-performance imaging and analysis capabilities. Its combination of advanced features, user-friendly design, and robust construction ensures that it meets the diverse needs of researchers and professionals. Whether you are conducting detailed material analysis, quality control, or educational usage, the SU3800/SU3900 SEM provides the performance and versatility needed to excel in your work.

Application

Sample : CNT

Accelerating voltage : 30 kV

Image signal : STEM

Magnification : 30,000x

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    F (60) 4645 6573
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