Hitachi SU3800/SU3900 SEM

Hitachi SU3800/SU3900 SEM

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Performance & Power in a Flexible Platform
Hitachi High-Technologies‘ scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.


1.Substantially Larger Specimen Chamber Accommodates Oversized and Heavy Samples

  • Robust Stage for Flexibility in Sample Size, Shape, and Weight
  • Increased Viewing Area—SEM MAP Expands the Boundaries of Sample Navigation

2.Evolution of the Market—Improved Automatic Functions for Operators of Any Skill Level

  • Multiple Modes of Operation
  • Automatic Functions for Operators of Any Skill Level
  • Multi Zigzag enables wide-area observation across multiple areas
  • Report Creator generates reports of acquired data

3.Integrated Solutions for Various Applications

  • High Sensitivity Detectors Supporting All Observation Requirements
  • A Variety of Accessories Mountable onto Any of the 20 Ports in the Innovative SU3900 Specimen Chamber.
  • SEM/EDS Integration System*
  • 3D Modeling Software: Hitachi map 3D*
  • Image Processing, Measurement, and Analysis Software: Image-Pro for Hitachi



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