The OXFORD C-Swift EBSD is a high-speed Electron Backscatter Diffraction (EBSD) detector designed for routine materials analysis and high throughput sample characterization. Similarly, this advanced system guarantees indexing speeds of 1000 pps using only 12 nA beam current, ensuring efficient and accurate data acquisition.
Features of Oxford C-Swift EBSD
Guaranteed indexing speeds of 1000 pps
- Using only 12 nA beam current
Exceptional sensitivity delivered by fibre optics and an optimised phosphor screen
- Ensuring high quality patterns at low doses and
low beam energies resulting in maximum spatial resolution
156 x 128 pixel pattern resolution at maximum speed
- 4 times more pixels than a fast CCD detector at comparable speeds
Full resolution (622 x 512) patterns
- Ideal for detailed phase and deformation analyses
Low distortion optics
- Ensuring an angular precision better than 0.05°
High sensitivity with an optimised phosphor screen
- Ensuring high quality patterns at low doses and
low beam energies – resulting in maximum spatial resolution
Seamless EDS integration even at the highest speeds
Bellows SEM interface
- Maintaining the microscope’s vacuum integrity
Unique proximity sensor
- Detects potential collisions before they happen and automatically moves the detector to a safe position
Simple and intuitive detector settings
- Ensuring optimum results every time
Five integrated forescatter detectors
- Providing full colour complementary channelling contrast and atomic number contrast images
The OXFORD C-Swift EBSD detector stands out as a versatile and efficient solution for Electron Backscatter Diffraction. Its high-speed performance, exceptional sensitivity, and user-friendly design make it an essential tool for researchers and professionals in materials science. Undoubtedly, with the C-Swift EBSD, you can achieve precise and reliable results, ensuring the success of your analytical endeavors.
