The Oxford C-Nano EBSD is a high-performance Electron Backscatter Diffraction (EBSD) detector designed to deliver exceptional results for a wide range of materials and applications. This advanced system guarantees indexing speeds of 400 pps using only 3 nA beam current, ensuring efficient and accurate data acquisition.
Features of Oxford C-Nano EBSD Detector
Guaranteed indexing speeds of 400 pps
- Using only 3 nA beam current
312 x 256 pixel pattern resolution at maximum speed
- 4 times more pixels than a sensitive CCD detector at comparable speeds
Full megapixel resolution patterns (1244 x 1024 pixels)
- Ideal for strain analyses using high resolution EBSD
High sensitivity with an optimised phosphor screen
- Ensuring high quality patterns at low doses and
low beam energies – resulting in maximum spatial resolution
Low distortion optics
- Ensuring an angular precision better than 0.05°
Seamless EDS integration
- Even at the highest speeds
Bellows SEM interface
- Maintaining the microscope’s vacuum integrity
Unique proximity sensor
- Detects potential collisions before they happen and automatically moves the detector to a safe position
Simple and intuitive detector settings
- Ensuring optimum results every time
Five integrated forescatter detectors
- Providing full colour complementary channelling contrast and atomic number contrast images
The Oxford C-Nano EBSD detector stands out as a versatile and effective solution for Electron Backscatter Diffraction. Its high-resolution patterns, optimized sensitivity, seamless integration, and user-friendly design make it an essential tool for researchers and professionals in materials science and engineering. With the C-Nano EBSD, you can achieve precise and reliable results, ensuring the success of your analytical endeavors.
