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Hitachi SU3900SE/SU3800SE Series High Resolution Schottky Scanning Electron Microscope (FE-SEM)"
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Hitachi SU3900SE/SU3800SE Series High Resolution Schottky Scanning Electron Microscope (FE-SEM)"
Home Microscopy Electron Microscopy FE-SEM HITACHI High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus
Hitachi Tabletop Scanning Electron Microscope
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Image of the Hitachi SU8700 Ultra-High-Resolution Schottky SEM, showcasing its advanced design and capabilities for ultrahigh-resolution imaging and microanalysis
HITACHI SU8700 Ultra-High-Resolution Schottky SEM (Demo Unit)

HITACHI High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus

  • The SU3900SE/SU3800SE Series Microscopes are FE-SEMs that offer high-resolution observation capabilities.
  • Combine easy data acquisition through simple operation with much larger and heavier specimens than existing FE-SEMs.
  • Possible to observe large and heavy specimens, including industrial materials such as iron and steel, automotive parts, and aerospace-related parts.
  • The SE Series lineup offers four models (two types with two grades) to meet the measurement needs of a wide variety of fields.
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  • Description
Description

Description

The Hitachi SU3900SE/SU3800SE Series High Resolution Schottky Scanning Electron Microscopes (FE-SEM) provide unparalleled high-resolution observation capabilities. Furthermore, these advanced microscopes excel at examining large and heavy specimens, making them perfect for a wide range of industrial applications

Features of Hitachi High-Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus

Schottky SEM with Large Specimen Chamber

The SU3900SE Series accommodates specimens up to 300mm in diameter, while the SU3800SE Series handles specimens up to 200mm in diameter. Consequently, this large specimen chamber expands application capabilities, making it ideal for a wide range of uses.

Eliminate Metal Coating and Specimen Preparation

Say goodbye to the need for metal coating of non-conductive specimens and the hassle of breaking or cutting large, heavy specimens. The SU3900SE/SU3800SE Series allows for observation from a variety of angles without additional preparation.

Enhanced Top-Surface Imaging

Experience improved resolution for both high and low accelerating voltages with the newly developed Schottky electron gun. This enhancement ensures detailed and precise top-surface imaging.

Automation and Usability

These microscopes feature an automatic optical adjustment function, significantly reducing manual work. Additionally, the EM flow creator supports automation of operations such as sequential image capture, making the process more efficient.

Recipe Creation for Automated Observation

Create recipes by simply dragging and dropping blocks into a flowchart arrangement. Then, execute these recipes for automatic observation, streamlining your workflow and enhancing productivity.

In conclusion, the Hitachi SU3900SE/SU3800SE Series High Resolution Schottky Scanning Electron Microscopes (FE-SEM) meet the diverse needs of various industries. With their large specimen chambers, high-resolution imaging, and advanced automation features, these microscopes provide precise and efficient observation of large and heavy specimens. Whether you’re working with industrial materials, automotive parts, or aerospace components, the SU3900SE/SU3800SE Series offers robust performance and versatility to enhance your research and analysis capabilities.

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