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Hitachi Tabletop Scanning Electron Microscope
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Hitachi SU3900SE/SU3800SE Series High Resolution Schottky Scanning Electron Microscope (FE-SEM)"
HITACHI High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus

HITACHI TM4000PlusIII/TM4000III Tabletop SEM

The TM4000PlusIII/TM4000III Tabletop Scanning Electron Microscope is the newest addition to a lineup of microscopes that have sold over 5,800 units worldwide. Our newest updates bring improvements to users at the forefront of R&D, quality control, and education.

  • High-Resolution Imaging: Provides detailed and precise imaging for various specimens.
  • Advanced Automation: Features automated observation and particle analysis for efficient workflows.
  • User-Friendly Design: Compact and easy to use, ideal for both research and industrial applications.
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  • Description
Description

Description

The Hitachi TM4000PlusIII/TM4000III Tabletop SEM  is designed to provide high-resolution imaging and advanced automation features in a compact and user-friendly design. Hence, this Tabletop Scanning Electron Microscope (SEM) is ideal for a variety of applications, offering precise and efficient specimen analysis.

Features of HITACHI TM4000PlusIII/TM4000III Tabletop SEM

Reduce Your Workload and Achieve More Consistent Results
  • Automated observation of multiple specimens: Recipe Control*1
  • Faster automatic particle analysis: High-current function + AZtecLiveLite particle analysis package*
  • Field-of-view navigation with less noise: High-current function
  • Plan Ahead with the Filament Monitoring Function
  • Maintenance planning: Filament monitoring function
  • Experience the world of electron microscopy with no preprocessing required
  • Low-vacuum function + high-sensitivity backscattered-electron detector
  • Build programming skills with workflow automation functions (TM4000PlusIII)*1

*1 Optional for TM4000PlusII only

*2 Optional

Features of Tabletop Scanning Electron Microscope

Simple steps to obtain quality image
  • Automation, observation & elemental analysis
  • Intuitive operation on Camera Navi (optional)
Various imaging applications using 4-under low vacuum status
  • Charge-up reduction mode
  •  Image various materials under low vacuum condition
  • Innovative SE detector to obtain surface details with non-conductive samples at lower vacuum conditions
High sensitivity UVD
20kV accelerating voltage
  • Enables higher speed EDS analysis
Multi zigzag function (Optional)
  •  It takes multiple high-magnification images and stitches them together to create a single high-resolution image

 

Ultimately, the Hitachi TM4000PlusIII/TM4000III Tabletop SEM meets the diverse needs of various industries. With its large specimen chambers, high-resolution imaging, and advanced automation features, this Tabletop Scanning Electron Microscope provides precise and efficient observation of large and heavy specimens. Whether you’re working with industrial materials, automotive parts, or aerospace components, the Tabletop Scanning Electron Microscope offers robust performance and versatility to enhance your research and analysis capabilities.

Applications of HITACHI TM4000PlusIII/TM4000III Tabletop Scanning Electron Microscope

Ball Grid Array observed under Hitachi Tabletop Scanning Electron Microscope

Ball Grid Array


Fluorescent Material observed under Hitachi TM4000PlusIII/TM4000III Tabletop Scanning Electron Microscope (SEM)

Fluorescent Material


Hydrogen Storage Alloy observed under Hitachi Tabletop Scanning Electron Microscope

Hydrogen Storage Alloy


Wire bond observed under Hitachi TM4000PlusIII/TM4000III Tabletop Scanning Electron Microscope (SEM)

Wire Bond


DRAM observed under Hitachi TM4000PlusIII/TM4000III Tabletop Scanning Electron Microscope (SEM)

DRAM


Ceramic observed under Hitachi Tabletop Scanning Electron Microscope

Ceramic

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