HITACHI SU7000 Ultra-High-Resolution Schottky SEM

The Hitachi SU7000 Ultrahigh-Resolution Schottky SEM is designed to meet the diverse needs of modern research and industrial applications. This advanced scanning electron microscope offers unparalleled imaging capabilities and user-friendly features.

Features of Hitachi SU7000 Ultrahigh-Resolution Schottky SEM

Versatile Imaging Capability

• Fast Signal Acquisition: Efficiently acquires multiple signals to address expansive SEM needs, from imaging a wide field of view to visualizing sub-nanometer structures.
• Advanced Electron Optics: Newly designed electron optics and detection systems allow for the simultaneous acquisition of multiple secondary electron and back-scattered electron signals.

Multi-Channel Imaging

• Simultaneous Signal Processing: Capable of processing, displaying, and saving up to six signals simultaneously, maximizing information acquisition.

Wide Variety of Observation Techniques

• Optimized Specimen Chamber and Vacuum System: Designed for large specimen sizes, sample manipulation at various axes, variable pressure conditions, cryogenic conditions, and in-situ observation under heating and cooling.

Microanalysis

• High-Performance Schottky Emitter: Provides up to 200 nA beam current for various microanalysis applications.
• Multiple Analytical Options: Supports EDX, WDX, EBSD, cathodoluminescence, and more, enhancing analytical capabilities.

Enhanced Information Acquisition

• Comprehensive Data Collection: Acquires structural, topographical, compositional, crystallographic, and other types of information with minimal changes to microscope conditions, such as working distance or accelerating voltage.

Single-Scan Multi-Signal Imaging

• Simultaneous Image Acquisition: Captures surface micro-structural information (UD), surface coating (MD), and overall topographic information (LD) in a single scan.

User-Friendly Interface

• Intuitive Graphical User Interface: Enhances signal display with a highly flexible screen layout and dual monitor setup.
• Expandable Observation and Analysis: Features a large specimen chamber and stage, optional camera navigation, various detectors for dynamic observation, and improved PD-BSED response speed.

Ultimately, the Hitachi SU7000 Ultra-High-Resolution Schottky SEM provides exceptional imaging performance and user-friendly features, supporting advanced research and industrial applications. With its versatile imaging capabilities, multi-channel imaging, and comprehensive microanalysis options, this SEM is an invaluable tool for scientists and engineers