Features:
- Unique ARL EQUINOX curved detector measures all diffraction peaks simultaneously across a wide angular range
Analysis is completed in just a few minutes on most samples regardless of resolution requirements - Same configuration between ARL EQUINOX 3000 and ARL EQUINOX 3500
With a respective real-time detection over 120° 2Ø and 90° 2Ø - Better resolution with ARL EQUINOX 3500 Diffractometer
Thanks to a bigger radius of CPS detector in comparison of ARL EQUINOX 3000 Diffractometer - No scanning required
- Resolute or fast monochromatic optic
Resolution and high intensity in the same instrument
Dynamic Studies
Studies of physical and chemical properties of materials require dynamic crystallographic measurements in real time. Structural phase transitions or modifications of materials can be captures as they occur thanks to Position Sensitive Detectors (PSD). PSD acquires the complete XRD spectrum simultaneously, ensuring that no transition is missed during a measurement, which is especially true with unstable compounds.
