Features:
- Guaranteed indexing speeds of 1000 pps
Using only 12 nA beam current - Exceptional sensitivity delivered by fibre optics and an optimised phosphor screen
Ensuring high quality patterns at low doses and
low beam energies resulting in maximum spatial resolution - 156 x 128 pixel pattern resolution at maximum speed
4 times more pixels than a fast CCD detector at comparable speeds - Full resolution (622 x 512) patterns
Ideal for detailed phase and deformation analyses - Low distortion optics
Ensuring an angular precision better than 0.05° - High sensitivity with an optimised phosphor screen
Ensuring high quality patterns at low doses and
low beam energies – resulting in maximum spatial resolution - Seamless EDS integration even at the highest speeds
- Bellows SEM interface
Maintaining the microscope’s vacuum integrity - Unique proximity sensor
Detects potential collisions before they happen and automatically moves the detector to a safe position - Simple and intuitive detector settings
Ensuring optimum results every time - Five integrated forescatter detectors
Providing full colour complementary channelling contrast and atomic number contrast images
