Micro-X-ray Fluorescence (Micro-XRF / µ-XRF) Analysis

Micro-X-ray Fluorescence (Micro-XRF) is a non-destructive analytical technique that provides precise elemental analysis and mapping on small areas of a sample. When integrated with a Scanning Electron Microscope (SEM), it allows simultaneous morphological imaging and detailed elemental characterization. In addition to mapping composition, Micro-XRF can measure layer thickness and detect trace elements without damaging the sample, making it ideal for advanced materials, coatings, and electronic components.

Applications

• Elemental Mapping:Visualize the distribution of elements across surfaces and microstructures.
• Composition Analysis:Determine the elemental makeup of metals, ceramics, polymers, and composites.
• Non-Destructive Layer Thickness Measurement:Measure the thickness of coatings, thin films, and multi-layered materials.
• Trace Element Detection:Identify and quantify low-concentration elements in materials.
• Coatings & Thin Films Assessment:Evaluate uniformity, composition, and contamination in coated surfaces.
• Semiconductor & Electronics Inspection:Detect impurities, inclusions, or defects in PCBs and microelectronic components.
• Failure & Quality Analysis:Correlate elemental distributions with defects, corrosion, or wear.
• Research & Development:Support materials design, surface engineering, and new product development.