Ellipsometers give non-contact thickness and refractive index measurements of thin transparent and semi-transparent films to sub-angstrom precision. Unlike other ellipsometers, Stokes Elipsometers utilize the complete state of polarization of the measuring beam to provide exceptional accuracy and precision. Gaertner has helped pioneer the field of ellipsometry and we offer high quality Stokes laser ellipsometers for routine measurements in the semiconductor, solar, chemical, biological and other thin film industries. They are a popular alternative to overly complicated spectroscopic ellipsometers at an affordable price.
The model LSE-USB with convenient USB interface use a advanced StokesMeter™ technology (previous winner of Photonics Spectra and Photonics Spectra and R&D 100 best new products awards). The unit’s simple robust design offers unprecedented ease of use and instantaneous measurement. It is a popular alternative to overly complicated ellipsometers for precise routine measurement.