The EDAX Elite T EDS System offers state-of-the-art energy dispersive spectroscopy (EDS) for scanning transmission electron microscope (STEM) applications and in-situ microscopy. This advanced system integrates data acquisition and signal processing electronics, significantly reducing noise and improving the signal-to-noise ratio for enhanced detection limits.
Features of EDAX Elite T EDS
Integrated Electronics
- The system features integrated data acquisition and signal processing electronics, ensuring high sensitivity and accuracy.
Windowless Design
- The Elite T detectors do not require the typical protective window, improving light element sensitivity and enhancing mapping speed and detection of light elements in low concentrations.
Automated Calibration
- The system includes automated calibration algorithms, providing fast, repeatable, and accurate setup.
Intelligent Detector
- The detector has built-in intelligence, allowing for automatic retraction to a safe position without user intervention.
Optimized Geometry
- The unique geometry of the Elite T provides an optimized solid angle, ensuring the best possible performance and faster data collection on sensitive samples.
Smart Features
- The system includes Smart Quant for powerful quantification routines, Smart Mapping for determining collection time and identifying elements, and Smart Drift for dynamic parameter adjustments.
Applications
The EDAX Elite T EDS System serves both expert and novice users, providing optimized analysis solutions for all TEM applications. It excels in compositional analysis and in-situ electron microscopy in STEM, offering exceptional data collection rates and sensitivity to both light and heavy elements.
Models
- Elite T Super: Features a 70 mm² chip.
- Elite T Ultra: Features a 160 mm² chip with a proprietary windowless x-ray sensor, delivering outstanding detection efficiencies and accelerating compositional mapping during material characterization studies.
The EDAX Elite T EDS System, with its advanced electronics, windowless design, and smart features, delivers unparalleled performance for detailed material characterization. It seamlessly integrates data acquisition, analysis, and reporting, making it the most intuitive and easy-to-use analytical tool for STEM applications.
Spectrum showing a SiO2 sample collected by an Elite T.
