Oxford Ultim® Extreme EDS Detector for Advanced Elemental Analysis
27 Jul

OXFORD Ultim® Extreme EDS Detector

The Oxford Ultim® Extreme Silicon Drift Detector is a breakthrough solution for ultra-high resolution FEG-SEM applications.
  • Windowless 100 mm² design maximizes sensitivity and spatial resolution.
  • Radical geometry optimizes both imaging and EDS performance at low kV and short working distances.
  • EDS resolution approaches that of the SEM, delivering solutions beyond conventional micro- and nano-analysis.
The Ultim® Extreme provides unparalleled performance for advanced elemental analysis.
Oxford Ultim® Max EDS Detector for Advanced EDS Analysis
27 Jul

OXFORD Ultim® Max EDS Detector

The Oxford Ultim® Max EDS Detector is the next generation of Silicon Drift Detectors (SDD) for advanced X-ray analysis in the SEM.
  • Combines the largest sensor sizes with Extreme electronics for unparalleled speed and sensitivity.
  • Allows up to 17x more data to be collected in the same time with no loss of accuracy.
  • Ideal for mapping larger areas, improving statistics in each data point, and investigating the smallest nanostructures.
The Oxford Ultim® Max EDS Detector offers exceptional performance and reliability for comprehensive elemental analysis.
27 Jul

EDAX Octane Elite EDS System

The game changing advancements in the Octane Elite SDDs take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite EDS System also uses state of the art electronics, which yield high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
27 Jul

EDAX Octane Elect EDS System

The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at an optimal value with a remarkable low energy sensitivity for light element detection and low voltage (kV) microanalysis.
27 Jul

EDAX Element EDS System

The Element Energy Dispersive Spectroscopy (EDS) System delivers powerful analytical capability in a compact package, maximizing performance and flexibility, while providing streamlined operation to guarantee fast results and ease of use. It is focused on the industrial market, where application specific problems need to be solved quickly and accurately. The combination of an Element Silicon Drift Detector (SDD) with the user-friendly APEX™ software provides a complete EDS microanalysis solution for all levels of analysis and high throughput industrial applications.
OXFORD Xplore EDS Detector for SEM Analysis
24 Jul

OXFORD Xplore EDS Detector

The Xplore EDS Detector is the next generation of EDS detector for routine analysis in the SEM.
  • Available in 15mm² and 30mm² sensor sizes, designed for a wide range of applications.
  • Utilizes new technology from the larger Ultim Max detectors for rapid data collection.
  • Guarantees automatic and reliable results for routine analysis applications.
The Xplore EDS Detector offers advanced technology and reliable performance for efficient SEM analysis.
EDAX Elite T EDS System with integrated data acquisition and signal processing electronics
13 Jul

EDAX Elite T EDS System

The Elite T is the next generation EDS system for transmission electron microscopy (TEM) utilizing a fast SDD with state-of-the-art integrated electronics. The unique geometry and powerful quantification routines of the Elite T provide optimized analysis solutions for all TEM applications.
  • Improves the light element sensitivity of the detector
  • Enhances the mapping speed and light element detection in low concentrations
  • Allows flexibility of sensor placement for maximum exposure to the signal
Experience unparalleled performance and detailed material characterization with the EDAX Elite T EDS System.
Bruker QUANTAX EDS Flash 7 Detector for Advanced Elemental Analysis
13 Jul

BRUKER QUANTAX EDS (Energy-Dispersive X-Ray Spectroscopy)

The Bruker QUANTAX EDS Flash 7 Detector is a cutting-edge solution for advanced elemental analysis.
  • Paired with a Scanning Electron Microscope (SEM) or a Transmission Electron Microscope (TEM), it features the XFlash® 7 detector series with the largest solid angle and highest throughput.
  • The enhanced hybrid pulse processor ensures rapid data collection and precise results.
  • Ideal for high-resolution diffraction patterns and reliable performance in materials science and engineering.
The Bruker QUANTAX EDS Flash 7 Detector offers exceptional performance and reliability for comprehensive elemental analysis.
Image of the Hitachi TM3030Plus tabletop SEM (scanning electron microscope) demo unit, a low-vacuum scanning electron microscope (SEM) showcasing its compact design and advanced features for high-quality imaging and analysis
22 Nov

HITACHI Tabletop TM3030Plus SEM (Demo Unit)

  • High-resolution imaging and advanced analytical capabilities of scanning electron microscope (SEM) in a compact, user-friendly design, ideal for materials science, biology, and industrial inspection.
  • Features high-sensitivity secondary electron detector, low vacuum imaging, and innovative technology for precise and reliable results, while maintaining the compact design as tabletop microscope
  • Demo unit Available: Hitachi Tabletop TM3030Plus
tm4000plusII hitachi tabletop demo unit SEM for failure analysis
22 Nov

HITACHI TM4000 PLUS II Tabletop SEM (Demo Unit)

  • It features innovation and cutting-edge technologies that redefine the capabilities of scanning electron microscope (SEM)
  • Integrates ease of use, optimized imaging, and high-image quality, while maintaining the compact design as tabletop microscope
  • Demo unit Available: Hitachi TM4000Plus II