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HomeSurface AnalysisXPS THERMOFISHER Scientific Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer(ARXPS) System
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THERMOFISHER Scientific Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System

THERMOFISHER Scientific Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer(ARXPS) System

Collect angle-resolved spectra without the need to tilt the sample to nondestructively characterize ultra-thin layers using the Thermo Scientific™ Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer System.
New and emerging technologies rely on the engineering of the near-surface region of a solid surface. For this type of material, including self-assembled monolayers, surface modified polymers and semiconductor devices, it is essential that the composition of the first few nanometers is known with confidence. The Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer System provides this information using parallel angle resolved XPS (PARXPS) and the advanced software of the Avantage data system, which produces accurate and precise answers.

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  • Description
Description

Features:

  • Patented technology provides the unique ability to collect angle-resolved XPS spectra over a 60° angular range in parallel
  • X-ray monochromator features a user-selectable spot size in the range 15 to 400µm
  • System is able to handle large or multiple samples
  • CCD sample alignment microscope is perpendicular to the sample surface

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