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HomeSurface AnalysisXPS THERMOFISHER Scientific Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System
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THERMOFISHER Scientific Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer(ARXPS) System
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THERMOFISHER Scientific Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System

Offer fully automated multi-technique analysis along with high throughput without sacrificing research grade results with the Thermo Scientific™ Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System. Integration of multiple analytical techniques like ISS, UPS, REELS and Raman allows users to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra-thin films, nanotechnology development and many other applications.

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  • Description
Description

Features:

  • Insulator analysis
  • High performance spectroscopy
  • Depth profiling
  • Multi-technique integration
  • Dual-mode ion source for expanded depth profiling capabilities
  • Tilt Module for ARXPS measurements
  • Advantage Software for instrument control, data processing, and reporting
  • Small spot analysis

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THERMOFISHER Scientific Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer(ARXPS) System

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15-G-26 Bayan Point Medan Kampung Relau 11900 Penang, Malaysia

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