THERMOFISHER Scientific Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System

Offer fully automated multi-technique analysis along with high throughput without sacrificing research grade results with the Thermo Scientific™ Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System. Integration of multiple analytical techniques like ISS, UPS, REELS and Raman allows users to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra-thin films, nanotechnology development and many other applications.

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Description

Description

Features:

Insulator analysis
High performance spectroscopy
Depth profiling
Multi-technique integration
Dual-mode ion source for expanded depth profiling capabilities
Tilt Module for ARXPS measurements
Advantage Software for instrument control, data processing, and reporting
Small spot analysis

THERMOFISHER Scientific Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System

Features:

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