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HITACHI MI4050 Focused Ion Beam System

HITACHI HF-5000 FE TEM

  • Unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance
  • 078 nm spatial resolution in STEM is achieved together with high specimen-tilt capability and large solid angle EDX detector(s), all in a single objective lens configuration
  • Features including fully automated aberration corrector, symmetrical dual SDD EDX and Cs-corrected SE imaging, with advanced TEM/STEM technologies
  • Optimum combination of sub-Å imaging and analysis, as well as the flexibility and unique capabilities to address the most advanced studies
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  • Description
Description

Features:

  • Hitachi fully automated probe-forming spherical aberration corrector
  • High-brightness and high-stability cold FE electron gun (Cold FEG)
  • Ultra-stable column and power supplies for enhanced instrument performance
  • Simultaneous Cs-corrected SEM & STEM imaging capability with atomic resolution
  • New high-stability side-entry specimen stage and specimen holders
  • Symmetrically opposed dual 100 mm2 EDX (optional) detectors : “Symmetrical Dual SDD*”
  • Newly designed enclosure for optimum performance in real laboratory environments
  • A wide range of Hitachi advanced specimen holders (optional)

Application

Si(211) single crystal HAADF-STEM image (left), image intensity profile (right lower) and FFT power spectrum (right upper)

 

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Quasi-S Pte Ltd
(HQ)

35 Marsiling Industrial Estate Road 3 #04-03, Singapore 739257.

T (65) 6383 4386
F (65) 6383 3071
E contact@quasi-s.com.sg

Quasi-S Technology Sdn Bhd
(Bangi Branch)

Block Stroma B3-1, UKM-MTDC Smart Technology Centre 43600 Bangi, Selangor, Malaysia

T (603) 8920 2570
F (603) 8920 2506
E inquirybangi@quasi-s.com.my

Quasi-S Sdn Bhd
(Penang Branch)

15-G-26 Bayan Point Medan Kampung Relau 11900 Penang, Malaysia

T (604) 645 6973
F (60) 4645 6573
E inquiry@quasi-s.com.my

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