Nanotechnology Singapore | Laboratory Equipment - Quasi-S
  • Company
  • Products
  • Services
  • Contact
Nanotechnology Singapore | Laboratory Equipment - Quasi-S
Menu
Click to enlarge
HomeMicroscopyElectron MicroscopyFIB HITACHI Ethos NX5000 Focused Ion And Electron Beam System
Previous product
HITACHI NX9000 Real-Time 3D Analytical FIB-SEM
Back to products
Next product
EVACTRON 50 E50 Series

HITACHI Ethos NX5000 Focused Ion And Electron Beam System

  • Incorporates the latest-generation FE-SEM with superb beam brightness and stability
  • Delivers high-resolution imaging at low voltages combined with ion optics for nanoscale precision processing
Add to quote loading
  • Description
Description

Features:

  • High-Performance FE-SEM Column with Dual Lens Mode
    – Ultra-high-resolution observation (HR mode: semi-in-lens)
    – High-accuracy end-point detection in real time
    (FF mode: Field Free (time sharing mode)
  • High-Throughput Material Processing
    – Ultra-fast processing with high ion-current density
    (Max. beam current: 100 nA)
    – User programmable script for auto processing and observation
  • Micro-sampling System
    – Fully integrated sample-orientation control for
    Anti-Curtaining Effect(ACE technology)
    – TEM sample preparation for uniform lamellas at any orientation
  • Triple-Beam Capable, Delivering Advanced Quality Results
    – Low-acceleration noble-gas ion-beam material processing
    – Innovative functions reduce Ga ion related and other milling artifacts
  • Large Multi-Port Chamber and Stage for Various Applications
    – Large sample size capable system with exceptional stage stability
    – Full range enhanced long-distance tracking (155 x 155mm)
  • Refined Electron Optics and Multi-Signal Detection
  • High-Resolution SEM Imaging & high-performance FIB
  • Time Sharing Mode
    – To maximize SEM observation while ion milling simultaneously
  • Cut & See for 3D structural analysis
  • High-Quality TEM Specimen Preparation Using Triple-Beam Technology
  • Optimized GUI for Maximum Efficiency
  • Next-Generation Interface for Custom Processing Modes and Recipes
  • Sample Chamber and Stage for Various Applications

Application

– High speed ion milling, SIM image

– Highlighting grain contrast of bond wire

Related Application

Close

OPTIKA Professional Stereo Microscopes – Modular Series

Close

OPTIKA B-380 Series

Close

OPTIKA Professional Stereo Microscopes – GEM Series

Close

HITACHI SU3800/SU3900 SEM

Close

OPTIKA Industrial Microscopes – MET Series

Close

OPTIKA Professional Stereo Microscopes – SZ Series

Close

HITACHI SU5000 Schottky FE-SEM

Close

OPTIKA IM-5 Series

© Quasi-S Pte. Ltd. . All right reserved.
Web Design Malaysia

company

Products

Services

contact

Quasi-S Pte Ltd
(HQ)

35 Marsiling Industrial Estate Road 3 #04-03, Singapore 739257.

T (65) 6383 4386
F (65) 6383 3071
E contact@quasi-s.com.sg

Quasi-S Technology Sdn Bhd
(Bangi Branch)

Block Stroma B3-1, UKM-MTDC Smart Technology Centre 43600 Bangi, Selangor, Malaysia

T (603) 8920 2570
F (603) 8920 2506
E inquiry@quasi-s.com.my

Quasi-S Sdn Bhd
(Penang Branch)

15-G-26 Bayan Point Medan Kampung Relau 11900 Penang, Malaysia

T (604) 645 6973
F (60) 4645 6573
E inquiry@quasi-s.com.my

  • Company
  • Products
  • Services
  • Contact