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Bruker HYPERION 3000 FTIR Microscope for Advanced Infrared Imaging
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BRUKER HYPERION 3000 FTIR Microscope

The Bruker HYPERION 3000 FTIR Microscope is a fully automated imaging microscope with modern focal plane array detector technology.

  • High-quality design ensures high stability and reliability.
  • Features contrast enhancement tools and a variety of dedicated objectives for sensitive microanalysis.
  • Controlled by OPUS all-in-one spectroscopy software for easy and convenient data acquisition.

The HYPERION 3000 enables efficient and precise microanalysis for advanced infrared imaging.

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  • Description
Description

The Bruker HYPERION 3000 FTIR Microscope is a fully automated FT-IR imaging microscope equipped with modern focal plane array detector technology. Its high-quality design, including all optical, mechanical, and electronic components, provides high stability and reliability. This advanced microscope is ideal for researchers and professionals in materials science and engineering who require precise and reliable results.

Features of the Bruker HYPERION 3000 FTIR Microscope

Single Transparent Knife-Edge Aperture

  • Equipped with a single transparent knife-edge aperture for precise measurements.

Polarized Light Measurements

  • Allows measurements with polarized light for enhanced analysis.

High-Resolution FTIR Imaging

  • Provides high-resolution FTIR imaging for detailed analysis.

Focal Plane Array (FPA) Detectors

  • With FPA detectors, up to 16,384 spectra can be measured simultaneously, ensuring comprehensive data collection.

The Bruker HYPERION 3000 FTIR Microscope offers exceptional performance and reliability for comprehensive infrared imaging. Its advanced technology, combined with innovative design features, ensures precise and dependable results. This makes it an essential tool for researchers and professionals in materials science and engineering.

Applications 

  • Routine analysis of standard samples.
  • In-depth examination of complex materials.
  • Effective characterization of beam-sensitive samples.
  • Optimized measurement of large samples.
  • High-resolution FTIR imaging for detailed analysis.

Absorbance spectra of 2 polymer films measured with DTGS detector and MCT detector.

ATR absorbance spectra of a polymer measured by a DTGS and MCT detector.

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