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HomeStress AnalysisFilm Stress CharacterizationFSM 128 Series FSM 128NT — Base System. Up To 200mm Wafer. Rotation Stage
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NANOPHOTON Raman Drive Wafer Analyzer
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FSM 128L -- Up To 300mm Wafer. Rotation Stage

FSM 128NT — Base System. Up To 200mm Wafer. Rotation Stage

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Quasi-S Pte Ltd
(HQ)

35 Marsiling Industrial Estate Road 3 #04-03, Singapore 739257.

T (65) 6383 4386
F (65) 6383 3071
E contact@quasi-s.com.sg

Quasi-S Technology Sdn Bhd
(Bangi Branch)

Block Stroma B3-1, UKM-MTDC Smart Technology Centre 43600 Bangi, Selangor, Malaysia

T (603) 8920 2570
F (603) 8920 2506
E inquiry@quasi-s.com.my

Quasi-S Sdn Bhd
(Penang Branch)

15-G-26 Bayan Point Medan Kampung Relau 11900 Penang, Malaysia

T (604) 645 6973
F (60) 4645 6573
E inquiry@quasi-s.com.my

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