Additional features : Dual Gun Baking system
Heatable Movable Aperture
Standard features 1. High probe current and high beam stability.
2. High resolution imaging.
3. Suitable for various analytica applications.
4. Integrated Robinson backscattered electron detector.
5. PCI image data manageme software.
The S-4300SE is a high resolution Analytical Schottky Emission Scanning Electron Microscope (SESEM) that suits the needs of users in material and life sciences as well as semiconductor disciplines.
It has been designed for applications that require;
1) high source brightness,
2) high probe current,
3) both short and long-term beam stability, and
4) high resolution imaging.
The S-4300SE gives guaranteed Secondary electron image resolution of 1.5nm. It’s flexibility allows integration with various optional accessories including Cathode Luminescence (CL), Electron Backscattered Diffraction Pattern (EBSP), Energy Dispersive X-ray Spectrometer (EDX) and Electron Beam Lithography (EB).
