Additional features : Dual Gun Bias
Long Liner Tube design
Standard features 1. Extra large capacity specimen chamber with high precision 5 axis motorised eucentric stage.
2. Patented Dual Bias and Secondary Electron Bias Plate.
3. Variable Pressure technology.
4. 5 horizontal and 3 inclined chamber ports.
5. Windows XP with full EDS integration packages for ultimate ease of use.
6. Optional Environmental Secondary Electron Detector (ESED) is available for SE imaging during Variable Pressure observation.
7. Industry’s largest pumping capacity for a VP-SEM.
8. PCI image database software.
The Hitachi S-3600N is designed for applications where sample size and weight are as important as image performance. It gives users guaranteed resolution of 3.0nm at high vacuum mode and resolution of 4.5nm at variable pressure mode.
The S-3600N, with variable pressure technology, allows examination of heavy samples with diameters up to 10 inches and permits examination of virtually any type of sample without the need for traditional sample preparation techniques. A total of 12 chamber ports provide the best possible geometry for numerous detectors and accessories such as EDX, WDX, EBSP, CL, BSE, electrical feedthrough and chamberscope.
The patented Dual Bias and Secondary Electron Bias plate increase beam current at low voltage generating exceptional image recordings. Coupled with Hitachi’s reputation for reliability, service and customer satisfaction, the S-3600N is a class above the rest for overall performance and ease of use.
