Additional features : Dual Gun Bias
Long Liner Tube design
Standard features 1. High resolution imaging in both conventional high vacuum and unique variable pressure modes.
2. Unique VP-mode of operation.
3. PC-controlled electronics.
Comfortable working GUI environment.
Mouse driven menus for changing operating modes with pressure settings ranging from 1 Pa-270 Pa in the sample chamber.
4. Wide range of optional accessorie
Super eucentric goniometer stage.
Cooling stage, etc.
5. Integration of EDX spectrometer utilizing a remote mouse and keyboard operation software available (option).
The S-3500N is the SEM series developed by Hitachi using PC controlled electronics. The versatile, easy to use S-3500H/N function with Windows XP and provides users with a comfortable working GUI environment. With the new GUI incorporated on the S-3500H/N, ease of use has been improved and new convenient features have been incorporated.
The S-3500H/N give guaranteed resolution of 3.5nm in high vacuum mode and resolution of 4.5nm in variable pressure mode. The variable pressure-mode allows microscopy of wet, oily and non-conductive samples in their natural state without the need of conventional sample preparation.
Added features such as the Dual Gun Bias and Linear Tube design, allows superior quality image recording and storage. Both SEMS have been designed to provide exceptional ease-of-use and expansiveness for future needs.
