Additional features : Dual Gun Bias
Long Liner Tube design
Standard features 1. True Windows XP environment.
2. Unique Dual Bias function for exceptional performance at low voltages.
3. User-friendly operation similar to commercial PC software.
4. Interactive monitor display and mouse-operated controls.
5. Both knob set and mouse control of SEM parameters.
Optional features 1. Integration of EDX spectrometer through software(Hi-Mouse) enabling the use of just one keyboard and one mouse to control both SEM and EDX systems.
2. Image management system for image processing, searching and archiving.
3. Motor driven specimen stages.
4. Network capability to transfer SEM images and data to external PCs and servers.
The S-3000N is a Variable Pressure SEM that allows microscopy of wet, oily and non-conductive samples in the natural state, while the S-3000H is a conventional high vacuum SEM. The SEM series S-3000H and S-3000N provides users with a guaranteed secondary electron image resolution of 3.0nm and BSE image resolution of 4.0nm.
Both SEMS come with superior additional features such as Dual Gus Bias and Long Linear Tube Design which allow high resolution low voltage operation. The low voltage operation is useful for microscopy of beam sensitive specimens as well as charge sensitive specimens. They have been designed to provide exceptional ease-of-use and expansiveness for future needs.
The S-30000H and S-3000N are versatile systems which can be equipped with an energy dispersive X-ray spectrometer (EDX) and permit elemental micro-analysis both in VP-mode and high vacuum mode.
