In response to industry trends, Hitachi has developed a compact SEM that both experienced, as well as novice, operators will find easy to use-the S-2600H/N. Utilizing an intelligent software interface, the S-2600H/N actually guides operators from the first step of selecting the proper operating conditions through the final step of image acquisition.
The S-2600H/N gives guaranteed secondary electron image resolution of 4.0nm and resolution of 5.0nm in variable pressure mode. The variable pressure-mode allows microscopy of wet, oily and non-conductive samples in their natural state without the need of conventional sample preparation.
The S-2600H and S-2600N are versatile systems which can be equipped with an energy dispersive X-ray spectrometer (EDX) and permit elemental micro-analysis both in VP-mode and high vacuum mode.
The flexible design of the S-2600H/N will allow the user to integrate optional accessories. This integrated SEM system offers a total analytical microscopy tool even for the most discriminate user.
