FA Instruments, Inc. is committed to building a corporation that is recognized as an industry leader in test and failure analysis equipment as well as for technical support and service. Our core competencies include Electrical Engineering, Mechanical Engineering and Visual C++ programming coupled with a specialized understanding of Analytical Test and Failure Analysis of Semiconductors. Our relevant and significant past experiences include, inventor of the “vibe coupler”, the “portable emission microscope” and technical creator of the FA1000. The original FA1000 liquid cooled camera was a huge success,selling on over 100 Emission Microscopes and almost 1500 systems for Life Sciences. We provide straightforward, powerful, modular and upgradeable tools for the semiconductor community.

 

FA Instruments specializes in failure analysis tools to investigate faults, defects and damage to semiconductors with scientific grade systems for  Photon Emission detection in the visible to NIR range.  We also manufacture “SIFT” Stimulus Induced Fault Testing systems.

In addition, FA Instruments offers the coherent laser light source designed by Jim Colvin Consulting Services that has proven to be a superior light source for backside  photon emission applications. This unit in standard configuration houses three lasers at 670nm for front side imaging in the visible range, 1064nm for imaging the backside through the silicon substrate and 1300nm for near-IR backside imaging with MCT or other mid-IR cameras.