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ThermoFisher ESCALAB 250Xi XPS Microprobe

ThermoFisher ESCALAB 250Xi XPS Microprobe

Equipped with a micro-focusing X-ray monochromator designed to deliver optimum XPS performance, the ESCALAB XI+ X-ray Photoelectron Spectrometer (XPS) Microprobe ensures maximum sample throughput. The multi-technique capability and availability of a range of preparation chambers and devices provides the solution to any surface analytical problem. Using the advanced Avantage data system for acquisition and data processing, maximum information is extracted from the data.

  • High sensitivity spectroscopy
  • Small area XPS
  • Depth profiling capability
  • Angle resolved XPS
  • Ion scattering spectroscopy (ISS) in base system
  • Reflected electron energy loss spectroscopy (REELS) in base system
  • “Preploc” chamber in base system
  • Multi-technique analytical versatility
  • Many sample preparation options
  • Automated, unattended analysis
  • Multiple sample analysis
  • Digitally-controlled EX06 ion gun is a high-performance ion source even when using low energy ions
  • Azimuthal sample rotation is available
  • Multi-technique capability
  • Other analytical techniques accommodated without compromise to the XPS performance
  • Reverse power supplies for the lenses and analyzer using the EX06 ion gun (ion scattering spectroscopy (ISS) is always available)
  • Electron gun can be operated at up to 1000V and provides an excellent source for REELS

Product Description

Equipped with a micro-focusing X-ray monochromator designed to deliver optimum XPS performance, the ESCALAB XI+ X-ray Photoelectron Spectrometer (XPS) Microprobe ensures maximum sample throughput. The multi-technique capability and availability of a range of preparation chambers and devices provides the solution to any surface analytical problem. Using the advanced Avantage data system for acquisition and data processing, maximum information is extracted from the data.

  • High sensitivity spectroscopy
  • Small area XPS
  • Depth profiling capability
  • Angle resolved XPS
  • Ion scattering spectroscopy (ISS) in base system
  • Reflected electron energy loss spectroscopy (REELS) in base system
  • “Preploc” chamber in base system
  • Multi-technique analytical versatility
  • Many sample preparation options
  • Automated, unattended analysis
  • Multiple sample analysis
  • Digitally-controlled EX06 ion gun is a high-performance ion source even when using low energy ions
  • Azimuthal sample rotation is available
  • Multi-technique capability
  • Other analytical techniques accommodated without compromise to the XPS performance
  • Reverse power supplies for the lenses and analyzer using the EX06 ion gun (ion scattering spectroscopy (ISS) is always available)
  • Electron gun can be operated at up to 1000V and provides an excellent source for REELS

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