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Ion Miller Technoorg Linda
Technoorg Linda Gentle Mill, Model IV8

Technoorg Linda Gentle Mill, Model IV8

The Gentle Mill is designed dedicated for final polishing, easy cleaning and improving of samples previously treated in standard high-energy ion mills or Focus Ion Beam (FIB) columns. Gentle Mill models are recommended to users who wish to achieve artefact-free and damage-free samples of the best possible quality, especially for :

  • Cross-sectional transmission electron microscope (XTEM)
  • Scanning transmission electron microscope (STEM)
  • High-resolution transmission electron microscopy (HRTEM)

These ion mills are also suitable for quick thinning of dimpled or thin (< 25 μm), planar, mechanically polished samples.


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Product Description

The Gentle Mill is designed dedicated for final polishing, easy cleaning and improving of samples previously treated in standard high-energy ion mills or Focus Ion Beam (FIB) columns. Gentle Mill models are recommended to users who wish to achieve artefact-free and damage-free samples of the best possible quality, especially for :

  • Cross-sectional transmission electron microscope (XTEM)
  • Scanning transmission electron microscope (STEM)
  • High-resolution transmission electron microscopy (HRTEM)

These ion mills are also suitable for quick thinning of dimpled or thin (< 25 μm), planar, mechanically polished samples.


Please complete the form below downloading the brochure(s)

After "Submit" -- please check your Email.
The brochure will send to you immediately.
If you do not receive, please verify your Email address again.
Thank you!

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