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Ion Miller Technoorg Linda
Technoorg Linda Gentle Mill, Model IV8

Technoorg Linda Gentle Mill, Model IV8

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Description

The Gentle Mill is designed dedicated for final polishing, easy cleaning and improving of samples previously treated in standard high-energy ion mills or Focus Ion Beam (FIB) columns. Gentle Mill models are recommended to users who wish to achieve artefact-free and damage-free samples of the best possible quality, especially for :

  • Cross-sectional transmission electron microscope (XTEM)
  • Scanning transmission electron microscope (STEM)
  • High-resolution transmission electron microscopy (HRTEM)

These ion mills are also suitable for quick thinning of dimpled or thin (< 25 μm), planar, mechanically polished samples.

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