The Gentle Mill is designed dedicated for final polishing, easy cleaning and improving of samples previously treated in standard high-energy ion mills or Focus Ion Beam (FIB) columns. Gentle Mill models are recommended to users who wish to achieve artefact-free and damage-free samples of the best possible quality, especially for :
- Cross-sectional transmission electron microscope (XTEM)
- Scanning transmission electron microscope (STEM)
- High-resolution transmission electron microscopy (HRTEM)
These ion mills are also suitable for quick thinning of dimpled or thin (< 25 μm), planar, mechanically polished samples.