NTEGRA Spectra II, the most versatile, fully integrated AFM-Raman-SNOM-TERS instrument. More than 30 general and advanced AFM modes are supported by the NT-MDT AFM providing extensive information about the sample’s physical properties. Simultaneous optical measurements of the same sample area provide the widest range of additional information about the sample – thus combining the best of all techniques. With hundreds systems installed worldwide, the constantly evolving and improving NTEGRA Spectra platform has become the best-selling device in the AFM-Raman-SNOM-TERS market. The instrument has been awarded the R&D 100 award.
Simultaneously measured AFM and Raman maps of exactly the same sample area provide complementary information about sample physical properties (AFM) and chemical composition (Raman).
NTEGRA Spectra II with the help of Tip Enhanced Raman Scattering (TERS) allows carrying out spectroscopy/microscopy with nanometer scale resolution. Specially prepared AFM probes (nanoantennas) can be used for TERS to enhance and localize light at the nanometer scale area near the tip apex. Such nanoantennas act as a “nano-source” of light giving possibility of optical imaging with resolution less than a diffraction limit (up to ~ 10 nm). Scanning near-field optical microscopy (SNOM) is another approach to obtain optical and spectroscopy images of optically active samples with resolution limited by probe aperture size (~ 100 nm).