Designed to meet the highest and most stringent standards of performance, reliability and repeatability, the Metavision X-Series, with its innovative multi-optics system, extended wavelength range and plethora of analytical features, assures the entire gamut of analytical features and analyses of the widest range of elements right down to trace levels.
The X-Series spectrometers have been designed specifically for those that require the highest level of accuracy and precision at extremely low limits of detection. Capable of analyzing just about every element possible and with low-PPM and sub-PPM limits of detection for each, the X-Series spectrometers are ideal for a wide range of users. Being CCD-based, there is never any need for hardware upgrades, even if new elements, bases or matrices are to be added post-purchase, with additions being simple and possible to do even on-site!
- Time-resolved spectroscopy
- Single SUS standardization
- Soluble-insoluble analysis
- 50+ elements; including low N, O, C
- Full 120-800 nm range
- Multi-CCD optics
- Trace analysis (PPM / sub-PPM)