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XY Digital Measuring Microscope
Gaertner XY Digital Measuring Microscope W126

Gaertner XY Digital Measuring Microscope W126

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Description

High speed film thickness measuring system measures in less than a second!

This Microscope is a powerful combination of optics, electronics and intelligence that compensates for mechanical errors, simplifies complex work steps and speeds repetitive measurements.  The microscope has a measuring range of 6 inches in the lateral X direction and 4 inches in Y using compact imbedded linear encoders.

The fully adjustable binocular head provides for comfortable viewing using both eyes and includes a 10X focusable wide field eyepiece with crosshair reticule. A three station turret nosepiece is supplied with a 3X microscope objective giving 30X total magnification. Optional microscope objectives are available to increase or decrease the magnification. A continuously adjustable halogen lamp gives surface illumination. Blue, green, and polarizing filters as well as an adjustable iris is supplied for added illumination control. A variable intensity sub stage LED illuminator is provided for viewing profiles and transparent objects. Knobs on either side of the dovetail slide column provide positive rack and pinion motion and control for focusing the viewing head assembly.

Measurements are easily made by positioning the part to be measured under the microscope crosshairs using the smooth X and Y stage positioning knobs. The stage position is automatically read to a  micron and sent by the imbedded linear X and Y encoders to the QC 200 digital display for intelligent interpretation. The high precision linear encoders cover the full 6 inch by 4 inch stage travel quickly without the use of additional gage blocks or spacers. Linear encoders are fast, precise and highly reliable with no moving parts to wear or break since they consist simply of a optical read head and linear scale. The XY stage travel is exceptionally smooth and orthogonal through the use of roller bearing construction and laser interferometer alignment during manufacture. Resolution to 1 micron can be easily achieved.

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