M4 TORNADO is the tool of choice for sample characterization using small-spot Micro X-ray Fluorescence (Micro-XRF) for information on composition and element distribution. Optimized for analysis speed and without compromising accuracy it measures a wide range of samples. Whether small or large, even or irregularly shaped — equipped with a large high-speed stage it supports 2D, non-destructive testing and analysis (NDT) of virtually any kind of inorganic, organic, and even of liquid sample. Its large vacuum chamber enables light element detection.
M4 TORNADO now features an optional 60 mm2 XFlash® SD detector for ultra high-speed spectra acquisition with up to 50 percent higher element sensitivity, compared to the standard 30 mm² active detector area, and significantly improves the measurement efficiency when using primary filters or analyzing light element samples. This new option is ideally suited for geology and other low yield applications, the analysis of thin samples, and low kV or tube current conditions. The 60 mm² XFlash® SDD is also available as a dual detector system which doubles sensitivity and throughput.
The M4 TORNADO analysis software 1.3 provides a flexible measurement setup and a variety of evaluation and processing tools. The new X Method module makes it easy to manage calibrations and standards and enables the user to develop and optimize analytical methods for complex applications, such as quantitative analysis of metallic multilayer stacks for composition and coating thickness.