Technoorg Linda Ion Miller
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Technoorg Linda Gentle Mill, Model IV8
The Gentle Mill is designed dedicated for final polishing, easy cleaning and improving of samples previously treated in standard high-energy ion mills or Focus Ion Beam (FIB) columns. Gentle Mill models are recommended to users who wish to achieve artefact-free and damage-free samples of the best possible quality, especially for :
- Cross-sectional transmission electron microscope (XTEM)
- Scanning transmission electron microscope (STEM)
- High-resolution transmission electron microscopy (HRTEM)
These ion mills are also suitable for quick thinning of dimpled or thin (< 25 μm), planar, mechanically polished samples.
Technoorg Linda Ion Miller SEM-Prep2 SC-2000
The SC-2000 model is equipped both with high- and low-energy ion sources. Rapid slope cutting with the high-energy ion gun followed by gentle surface cleaning with the low-energy ion gun provides cross-sectional SEM samples suitable for semiconductor failure analysis and other analytical purposes. The system also provides an ion milling based solution for improving and cleaning of mechanically polished SEM samples and preparation of damage-free surfaces for EBSD technique. The new 16 keV ultra-high energy ion source is more powerful and has higher sputtering rate as before.
- Cross-sectional sample preparation by slope cutting in 90°, 45° and 30° by different sample holders
- Final polishing and cleaning of traditional SEM and EBSD samples
- Load-lock system for faster and easier sample exchange
- High-energy ion gun for rapid milling
- Optional ultra high-energy ion gun specially recommended for ion milling extra hard materials or for extreme fast milling
- Low-energy ion gun for gentle surface polishing and cleaning
- Automated parameter settings and operation • Sample rotation and oscillation
- Real-time monitoring of the milling process by high-resolution CMOS camera and TFT monitor
Technoorg Linda IV7 UniMill — Ion Miller
IV7 UniMill is designed for extremely rapid preparation of high-quality Transmission Electron Microscopes (TEM) samples with unsurpassed high thinning rate.
It enables both rapid milling with the ultra-high-energy noble gas ion source and final polishing and cleaning with the patented low-energy ion gun.
For application, the Ion-Miller is for users who are developing new materials or new sample preparation methods and due to its extreme milling rate it is also recommended for studying materials of very low sputtering rate, such as diamond, sapphire, etc.
Its exclusive capability of producing damage-free and artefact-free samples by low-energy ion bombardment provides unique opportunity to study real nano-structures in synthesized and natural materials in all fields of technical sciences and materials research.
•Fast thinning and gentle polishing/cleaning with the same instrument
•Fully automated ion source setup and ion mill operation
•Widest range of ion energies: from 100 eV to 16 keV using ultra-high-energy and low-energy noble gas ion sources
•Extremely high milling rates:
900 μm/hour for monocrystalline Si at 16 keV and at 30º angle of beam incidence
•Optional liquid nitrogen cooling
Technoorg Linda MAG*I*CAL TEM Calibration Sample
The magnification calibration is the most common calibration in the electron microscopy, since it is important to know if the magnification value on the microscope console or on the image is accurate, if not how to correct the value. With the unique MAG*I*CAL calibration sample you can perform this calibration in the entire range of magnification in a Transmission Electron Microscopes (TEM) from about 1000x up to 1,000,000x.Since the sample itself is a single crystal, it can also be used to perform camera constant calibration and also image/diffraction pattern rotation calibration.
Although the MAG*I*CAL calibration sample was developed by materials scientist, life scientists doing TEM will find the use of MAG*I*CAL to be equally useful