Technoorg Linda Ion Miller

Technoorg Linda Ion Miller

The present TL company was founded in 1990 by Research Institute of Technical Physics of the Hungarian Academy of Sciences, Budapest, General Physics Institute of the Russian Academy of Sciences, Moscow, and by famous scientists like Prof. Norbert Kroo, Prof. A. M. Prohorov (Nobel Prize Laureate, 1964), Prof. Árpád Barna and Dezső Szigethy, internationally recognized members of the scientific community. The owner’s list was often subject to change during years. Today Technoorg Linda is mainly privately owned. Research and development of new methods and instruments is run jointly by our own team and researchers of selected university and academic institution members. The company’s mission statement is the following: Ensuring highest-quality ion beam thinning for all kinds of materials and samples. Research and development in environmental monitoring and measurements. Modelling and monitoring of aerosol-caused health effects. In order to satisfy the quality requirements of our customers Technoorg Linda has implemented and maintains a Quality Management System which fulfils the requirements of the ISO 9001:2000 standard since 2004. The aim of TL’s sales policy is to bring our services as close as possible to the end users. For this end the marketing department established a network of representatives, the number of local points is gradually expanding.
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Showing all 4 results

  • Ion Miller Technoorg LindaQuick view

    Technoorg Linda Gentle Mill, Model IV8

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    The Gentle Mill is designed dedicated for final polishing, easy cleaning and improving of samples previously treated in standard high-energy ion mills or Focus Ion Beam (FIB) columns. Gentle Mill models are recommended to users who wish to achieve artefact-free and damage-free samples of the best possible quality, especially for :

    • Cross-sectional transmission electron microscope (XTEM)
    • Scanning transmission electron microscope (STEM)
    • High-resolution transmission electron microscopy (HRTEM)

    These ion mills are also suitable for quick thinning of dimpled or thin (< 25 μm), planar, mechanically polished samples.


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  • SamPrep MillingQuick view

    Technoorg Linda Ion Miller SEM-Prep2 SC-2000

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    The SC-2000 model is equipped both with high- and low-energy ion sources. Rapid slope cutting with the high-energy ion gun followed by gentle surface cleaning with the low-energy ion gun provides cross-sectional SEM samples suitable for semiconductor failure analysis and other analytical purposes. The system also provides an ion milling based solution for improving and cleaning of mechanically polished SEM samples and preparation of damage-free surfaces for EBSD technique. The new 16 keV ultra-high energy ion source is more powerful and has higher sputtering rate as before.

    • Cross-sectional sample preparation by slope cutting in 90°, 45° and 30° by different sample holders
    • Final polishing and cleaning of traditional SEM and EBSD samples
    • Load-lock system for faster and easier sample exchange
    • High-energy ion gun for rapid milling
    • Optional ultra high-energy ion gun specially recommended for ion milling extra hard materials or for extreme fast milling
    • Low-energy ion gun for gentle surface polishing and cleaning
    • Automated parameter settings and operation • Sample rotation and oscillation
    • Real-time monitoring of the milling process by high-resolution CMOS camera and TFT monitor

    SamPrep Ion Miller pic 1

    SamPrep Ion Miller pic 2


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  • Ion Miller Technoorg LindaQuick view

    Technoorg Linda IV7 UniMill — Ion Miller

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    IV7 UniMill is designed for extremely rapid preparation of high-quality Transmission Electron Microscopes (TEM) samples with unsurpassed high thinning rate.
    It enables both rapid milling with the ultra-high-energy noble gas ion source and final polishing and cleaning with the patented low-energy ion gun.

    For application, the Ion-Miller is for users who are developing new materials or new sample preparation methods and due to its extreme milling rate it is also recommended for studying materials of very low sputtering rate, such as diamond, sapphire, etc.
    Its exclusive capability of producing damage-free and artefact-free samples by low-energy ion bombardment provides unique opportunity to study real nano-structures in synthesized and natural materials in all fields of technical sciences and materials research.

    FEATURES
    •Fast thinning and gentle polishing/cleaning with the same instrument
    •Fully automated ion source setup and ion mill operation
    •Widest range of ion energies: from 100 eV to 16 keV using ultra-high-energy and low-energy noble gas ion sources
    •Extremely high milling rates:
    900 μm/hour for monocrystalline Si at 16 keV and at 30º angle of beam incidence
    •Optional liquid nitrogen cooling

    iv7

     


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  • TEM Calibration Sample Technoorg LindaQuick view

    Technoorg Linda MAG*I*CAL TEM Calibration Sample

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    The magnification calibration is the most common calibration in the electron microscopy, since it is important to know if the magnification value on the microscope console or on the image is accurate, if not how to correct the value. With the unique MAG*I*CAL calibration sample you can perform this calibration in the entire range of magnification in a Transmission Electron Microscopes (TEM) from about 1000x up to 1,000,000x.Since the sample itself is a single crystal, it can also be used to perform camera constant calibration and also image/diffraction pattern rotation calibration.

    Although the MAG*I*CAL calibration sample was developed by materials scientist, life scientists doing TEM will find the use of MAG*I*CAL to be equally useful

    magical 2

     


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