SIGRAY

SIGRAY

Quasi-S  has partnered with Sigray, Inc. who is a San Francisco Bay Area company founded with the aim to accelerate scientific progress by providing powerful, synchrotron-grade research capabilities in its laboratory x-ray systems. These systems represent a major step-change from existing laboratory x-ray systems and their breakthrough performance are uniquely enabled by Sigray’s patented innovations in x-ray source, optics, and detector technologies. Since its founding in 2013, Sigray’s products have already been adopted by prominent scientific leaders in Asia, America, and Europe. 
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Showing all 2 results

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    AttoMap MicroXRF

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    The Sigray AttoMap™ is a powerful Micro x-ray fluorescence (microXRF) provides quantitative analysis of the elemental composition of samples and can provide thickness measurements of buried layers.

    Key Features:

    • Highest resolution microXRF at <8 um
    • Down to single atomic layer sensitivity, with trace elemental sensitivity down to sub-ppm (femtogram)
    • Performance comparable to synchrotron microXRF

    Applications:

    • Thin film measurements (e.g. semiconductor)
    • Contaminants
    • Trace-level elements in biological tissue or geological sample

    The powerful sensitivity and high resolution of the AttoMap produces synchrotron-quality elemental distribution mapping of trace elements for a wide range of research applications, spanning from the life and materials sciences to industrial use for pharmaceuticals, natural resources (oil and gas, mining), and semiconductor failure analysis.

    Semiconductor Package

    Failed semiconductor package with TSVs and microbumps. Found differences in Ni and Cu distributions in failed vs control sample.

     

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    NanoXRM

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    The NanoXRM was developed by Sigray and led the development of the 50-nm UltraXRM system, to be the most powerful 3D x-ray microscope on the market, with spatial resolution reaching down to 40 nanometers and tri-energy capabilities.

    • Highest Resolution 3D Nano-CT
    • To Determine Internal Structural Information