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EDAX Element Silicon Drift Detector
EDAX detector delivers powerful analytical capability in a compact package, maximizing performance and flexibility, while providing streamlined operation to guarantee fast results and ease of use. It offers excellent resolution and market-leading throughput, and is designed with a silicon nitride (Si3N4) window to optimize low energy X-ray transmission for light element analysis. Backed by application-specific software, Element provides fast and efficient results for industrial analysis needs. The features include :
- Excellent resolution and resolution stability ensure the collection of high-quality data on all types of samples and under all microscope conditions.
- Based on a 25mm2 chip.
- A Si3N4 window improves performance for light elements and low energies.
Advanced, low-noise electronics for outstanding throughputs to turn input counts into results.
- Can be installed on both Scanning Electron Microscopes(SEM) and Transmission Electron Microscopes (TEM).