Bruker XRF

Bruker XRF

The name Bruker is almost synonymous with advanced nanatechnology research and is the brand of choice of many R&D labs and technology manufacturing companies. For over 50 years now, Bruker is committed to always provide the best technological solution for each analytical task. Quasi-S has been working closely with Bruker in Singapore and Malaysia regions. We provide round the clock service support to customers with our knowledge and experience in Bruker’s Products and their applications.
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Showing all 12 results

  • Bruker M1 MISTRAL Micro-XRF SpectrometerQuick view

    Bruker M1 MISTRAL Micro-XRF Spectrometer

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    The M1 MISTRAL is a compact tabletop Micro-XRF spectrometer for the analysis of bulk materials and coatings. Designed for fast and cost-efficient operation it provides accurate information on the elemental composition of materials. The instrument features high spatial resolution and spot sizes down to 100 µm. Arbitrarily shaped samples, like the most intricate pieces of jewelry, can be analyzed without further preparation, and nondestructively. Sample sizes of up to 100x100x100 mm³ are supported. A video microscope with cross hair-functionality facilitates exact pinpointing of the desired measurement location. The motorized Z-stage allows fast focusing. The optionally available X-Y-Z stage provides even greater ease of use. The M1 MISTRAL is equipped with a high brightness micro-focus X-ray tube that ensures excellent excitation of the measurement spot resulting in a high fluorescence yield. With its powerful, yet easy-to-use, XSpect software suite, the instrument delivers accurate quantification results, no matter whether analyzing bulk materials or the most complicated multi-layer structures.


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  • Bruker XRF M2Quick view

    Bruker M2 BLIZZARD Slotted Micro-XRF Spectrometer

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    This small-spot X-ray fluorescence (XRF) spectrometer is specifically designed for the non-destructive testing and analysis (NDT) of printed circuit boards (PCB) in accordance with ASTM B568 and DIN/ISO 3497 standards. The slotted sample chamber and the large tray support fast and exact positioning of all types of PCBs from small to oversized that extend the sample chamber. Its rugged construction allows the M2 BLIZZARD to be used on the shop floor.

    The 2016 revamped M2 BLIZZARD is equipped with a high-performance silicon drift detector which is suitable for the analysis of thinner layers and unknowns as well as for routine analysis. The powerful video microscope system provides an auto focus function. Ease-of-use is further enhanced by software support of an optional industrial-strength foot switch and touchscreen operation.
    Equipped with the latest version of Bruker’s XSpect Pro and XData software packages, the M2 BLIZZARD is particularly attractive for the analysis of metal multilayers that are common to PCBs. Layer systems consisting of up to 12 layers with up to 25 elements each can be characterized with regard to composition and thickness.

    Experienced supervisors can use the configurability of the software to define measurement methods fine-tuned to the samples to be analyzed. These methods can then be routinely used by staff at the production site to perform the actual analyses for quality control. Setting up and performing these analyses is intuitive so that introductory training of staff is sufficient. The PASS/FAIL determination of the software or trend line display with upper and lower control limits lets the operator see immediately whether a sample is of acceptable quality or not. Reporting and data archiving functions are included as well and data can be exported to Excel®.


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  • Bruker M4 TORNADO Micro-XRF SpectrometerQuick view

    Bruker M4 TORNADO Micro-XRF Spectrometer

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    M4 TORNADO is the tool of choice for sample characterization using small-spot Micro X-ray Fluorescence (Micro-XRF) for information on composition and element distribution. Optimized for analysis speed and without compromising accuracy it measures a wide range of samples. Whether small or large, even or irregularly shaped — equipped with a large high-speed stage it supports 2D, non-destructive testing and analysis (NDT) of virtually any kind of inorganic, organic, and even of liquid sample. Its large vacuum chamber enables light element detection.

    M4 TORNADO now features an optional 60 mm2 XFlash® SD detector for ultra high-speed spectra acquisition with up to 50 percent higher element sensitivity, compared to the standard 30 mm² active detector area, and significantly improves the measurement efficiency when using primary filters or analyzing light element samples.  This new option is ideally suited for geology and other low yield applications, the analysis of thin samples, and low kV or tube current conditions. The 60 mm² XFlash® SDD is also available as a dual detector system which doubles sensitivity and throughput.

    The M4 TORNADO analysis software 1.3 provides a flexible measurement setup and a variety of evaluation and processing tools. The new X Method module makes it easy to manage calibrations and standards and enables the user to develop and optimize analytical methods for complex applications, such as quantitative analysis of metallic multilayer stacks for composition and coating thickness.


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  • Bruker M6 JETSTREAM Portable Micro-XRF SpectrometerQuick view

    Bruker M6 JETSTREAM Portable Micro-XRF Spectrometer

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    The Bruker M6 JETSTREAM is designed for the non-destructive testing and analysis (NDT) of large samples, Eg. Large paintings or bulky artefacts. The mobility of the instrument allows it to be placed at the site of the object of interest, be it in a gallery, museum or on the shop floor. The performance parameters enable scanning areas of 800 mm x 600 mm with a variable spot size down to 100 µm and speeds of up to 100 mm/s. As the system is capable of measurement "on-the-fly" this results in a pixel dwell time of as short as 1 ms. Measurement rig can be tilted, allowing samples to be scanned either horizontally or vertically. The spot size of the M6 JETSTREAM can be adapted in five steps to match the structure of the sample and the desired spatial resolution. Bruker's advanced XFlash® silicon drift detectors (SDD) are used for the detection of fluorescence radiation. They feature high count rate capability and best energy resolution over a wide count rate range. Special safety circuitry provides optimal user protection against exposure to X-rays Ultrasound distance measurement safeguards against collision with the measurement object. Regardless of sample size, the M6 JETSTREAM can be easily positioned due to its mobility. It can be disassembled into four parts which makes it transportable.


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  • Quantax EBSDQuick view

    Bruker Quantax EBSD

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    Based on SEM, Bruker's QUANTAX EBSD measures the local crystal orientation with sub-micron spatial resolution. It can be used for phase distribution analysis which reveals presence of hard and brittle inter-metallic phases sigma and chi. It can also be used for orientation distribution mapping which allows visualization of the strain accumulated at the boundary between the ferrite and sigma phase grain. The system can also be used in conjunction with the QUANTAX EDS system creating the most advanced integrated EBSD/EDS system, supported by the ESPRIT 2 software under a single user interface.


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  • Bruker QUANTAX Micro-XRFQuick view

    Bruker QUANTAX Micro-XRF (XTrace on SEM)

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    QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF spectrometer to a scanning electron microscope. XTrace fits on a free inclined chamber port of almost any SEM. The user benefits from both the trace element sensitivity and the higher information depth of XRF analysis. A complete micro-XRF spectrometer without the investment
    • Distribution analysis with HyperMap stores complete spectra for every map point for on- and offline analysis
    • Samples can be analyzed with Micro-XRF and EDS without position change
    • Both methods are integrated in the same analytical software suite - ESPRIT 2.0
    • No interference with normal SEM operation, XTrace can stay in its measurement position most of the time.
    • Analytical results compare to those of standalone systems
    • Image tiling allows mapping large areas
    • Selectable primary radiation filters to suppress diffraction peaks
    • Uses the SEM motorized stage
    • Allows sample tilt to produce minimum spot sizes.


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  • Bruker VERTEX 80 Series FTIR SpectrometerQuick view

    Bruker VERTEX 80 Series FTIR Spectrometer

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    The VERTEX 80 series Fourier Transform Infrared Spectroscopy FTIR spectrometers are based on the actively aligned UltraScan™ interferometer, which provides PEAK spectral resolution. The precise linear air bearing scanner and PEAK quality optics guarantees the ultimate sensitivity and stability. The VERTEX 80v is an evacuated optics bench that can eliminate atmospheric moisture absorptions for ultimate sensitivity and stability; enabling demanding experiments such as high resolution, ultra fast rapidscan, step-scan, or UV spectral range measurements. The VERTEX 80/80v optics design allows PEAK flexibility and at the same time PEAK instrument performance. The unique Bruker Optics DigiTect™ technology prevents external signal disturbance, guarantees PEAK signal-to-noise ratio and allows easy and reproducible detector exchange by the instrument user.


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  • Bruker VERTEX 70 Series FTIR SpectrometerQuick view

    Bruker VERTEX 70 Series FTIR Spectrometer

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    VERTEX 70 series offer unmatched performance and versatility for demanding analytical and research applications in Fourier Transform Infrared Spectroscopy FTIR. Its innovative design results in the highest flexibility and highest performance. The data acquisition is based on two channel delta sigma ADCs with 24-bit dynamic range, which are running in parallel and integrated into the detector pre-amplifier electronics. This advanced DigiTect technology prevents external signal disturbance and guarantees the highest signal-to-noise ratio. The new VERTEX FM functionality provides the unique possibility to acquire a complete far and mid IR spectrum from 6000 cm-1 to 80 cm-1 (or to 50 cm-1 with the VERTEX 70v vacuum optics bench) in a single step measurement.


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  • Bruker TENSOR II FTIR SpectrometerQuick view

    Bruker TENSOR II FTIR Spectrometer

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    TENSOR II is a high performing Fourier Transform Infrared Spectroscopy FTIR spectrometer with a compact size. It combines the highest sensitivity and outstanding flexibility, with an intuitive and easy to operate interface. These features make TENSOR II the best choice for advanced applications in industrial R&D and academia. TENSOR II has been designed to extend the strength of the well-established TENSOR series by innovation. As the first spectrometer in its class TENSOR II utilizes a modern diode laser. Furthermore TENSOR II provides a new electronic stabilization function for the IR source. These features greatly increase the life time of the two major wear parts in IR spectrometers and further reduce your maintenance costs and efforts.


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  • Bruker LUMOS FTIR MicroscopeQuick view

    Bruker LUMOS FTIR Microscope

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    The LUMOS is a fully automatic standalone Fourier Transform Infrared Spectroscopy FTIR microscope:
    • Highly comfortable and easy in use
    • Motorized ATR crystal (ATR = Attenuated total reflection)
    • Fully automated measurement in transmission, reflection and ATR mode
    • Large working distance; allowing ample space for sampling
    • Outperforming quality in both IR and VIS range
    • Space saving footprint


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  • Bruker HYPERION Infra-Red MicroscopeQuick view

    Bruker HYPERION IR Microscope

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    HYPERION series provide the highest level of infrared microanalysis capabilities, utilizing state-of-the-art optics for optimal sample visualization and infrared data collection. Bruker’s HYPERION is an infrared microscope that can be used in various routine and advanced research applications; including life sciences, art conservation studies, forensics, polymer research, failure analysis etc. Featuring infrared chemical imaging, crystal-clear sample viewing and a wide variety of IR and visible objectives, the HYPERION provides you with everything needed to conduct the most sensitive microanalysis easily and efficiently.


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  • Bruker ALPHA FTIR SpectrometerQuick view

    Bruker ALPHA FT-IR Spectrometer

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    The ALPHA delivers the performance and reproducible results people have come to expect from a Bruker FT-IR spectrometer. The ALPHA is also insensitive to vibration, so it can be placed almost anywhere, can be moved, and be immediately operational without any need for alignment. It delivers excellent sensitivity as well as x-axis reproducibility and stability. The ALPHA makes FT-IR analysis simpler than it has ever been before. With its plug-and-play operation, easy to set-up and ease of use, the ALPHA brings practicality to FT-IR spectroscopy.


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