Mechanical Properties Testing

Mechanical Properties Testing

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  • Micro Hardness Tester JapanQuick view

    Highwood Digital Hardness Testers

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  • Sonohard Ultrasonic Hardness tester JapanQuick view

    Sonohard Ultrasonic Handy Hardness Tester

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  • Micro-Hardness Tester Sample Preparation ATMQuick view

    ATM CARAT 930 Micro-Hardness Tester

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    The latest technology and intuitive application make the CARAT 930 into an extraordinary product for micro-hardness testing and optical evaluation. Measurements are performed highly precisely and easily through new, unrivalled methods. Our robust basic unit can be optimally suited to your requirements with our own in-house software modules and the Carat sample clamping system.


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  • Micro Hardness Tester JapanQuick view

    Highwood VIA Wide range Hardness Tester

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  • Micro Hardness Tester JapanQuick view

    Highwood RIA Automatic Hardness Tester

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  • Gaertner Stokes EllipsometerQuick view

    Gaertner Stokes Ellipsometer LSE-MS

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    High speed film thickness measuring system measures in less than a second!

    The LSE-MS ellipsometer uses using advanced StokesMeter™ technology (previous winner of  Photonics Spectra and R&D 100 best new products awards) with no moving parts and no modulators to quickly and accurately determine the complete polarization state of the 6328Å laser measuring beam at a 70° incidence angle. The laser light source has ample light intensity for increased measurement accuracy of absorbing and rough scattering films. Laser sources have the added advantage of being spectrally precise, stable and long lasting. Their use permits optimum instrument design in optics, detectors and other components so that measurements can be made highly accurate. The space-saving design features a small footprint yet it can accommodate large samples up to 300mm wide. The sample table includes a manual tilt and table height adjustment which is set using an alignment screen on the computer.

    • Tilt-free, focus free, hands-off operation for similar wafers.
    • Fastest possible instrument for thin film measurement.
    • Trouble-free, no moving parts advanced StokesMeter™ measurement head.
    • Measures complete state of polarization useful for rough, scattering samples.
    • Accurate, stable measurements using spectrally precise laser ellipsometry.
    • Simple, compact tabletop instrument - competitively priced.

     


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  • Gaertner Stokes EllipsometerQuick view

    Gaertner Stokes Ellipsometer LSE-USB

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    High speed film thickness measuring system measures in less than a second!

    The Stokes Ellipsometer LSE-USB with convenient USB interface uses advanced StokesMeter™ technology (previous winner of  Photonics Spectra and R&D 100 best new products awards). The unit's simple yet robust design offers unprecedented ease of use and instantaneous measurement at a cost under $20K. It is a popular alternative to overly complicated ellipsometers.

    lse-usb4

    This  ellipsometer uses advanced StokesMeter™ technology with no moving parts and no modulators to quickly and accurately determine the complete polarization state of the 6328Å laser measuring beam at a 70° incidence angle. The laser light source has ample light intensity for increased measurement accuracy of absorbing and rough scattering films. Laser sources have the added advantage of being spectrally precise, stable and long lasting. Their use permits optimum instrument design in optics, detectors and other components so that measurements can be made highly accurate. The space-saving design features a small footprint yet it can accommodate large samples up to 300mm wide. The sample stage can be easily moved by hand to measure any point on the sample surface. The sample table includes a manual tilt and table height adjustment which is set using an alignment screen on the computer.

     

     

     

     


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  • XY Digital Measuring MicroscopeQuick view

    Gaertner XY Digital Measuring Microscope W126

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    High speed film thickness measuring system measures in less than a second!

    This Microscope is a powerful combination of optics, electronics and intelligence that compensates for mechanical errors, simplifies complex work steps and speeds repetitive measurements.  The microscope has a measuring range of 6 inches in the lateral X direction and 4 inches in Y using compact imbedded linear encoders.

    The fully adjustable binocular head provides for comfortable viewing using both eyes and includes a 10X focusable wide field eyepiece with crosshair reticule. A three station turret nosepiece is supplied with a 3X microscope objective giving 30X total magnification. Optional microscope objectives are available to increase or decrease the magnification. A continuously adjustable halogen lamp gives surface illumination. Blue, green, and polarizing filters as well as an adjustable iris is supplied for added illumination control. A variable intensity sub stage LED illuminator is provided for viewing profiles and transparent objects. Knobs on either side of the dovetail slide column provide positive rack and pinion motion and control for focusing the viewing head assembly.

    Measurements are easily made by positioning the part to be measured under the microscope crosshairs using the smooth X and Y stage positioning knobs. The stage position is automatically read to a  micron and sent by the imbedded linear X and Y encoders to the QC 200 digital display for intelligent interpretation. The high precision linear encoders cover the full 6 inch by 4 inch stage travel quickly without the use of additional gage blocks or spacers. Linear encoders are fast, precise and highly reliable with no moving parts to wear or break since they consist simply of a optical read head and linear scale. The XY stage travel is exceptionally smooth and orthogonal through the use of roller bearing construction and laser interferometer alignment during manufacture. Resolution to 1 micron can be easily achieved.


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