Elemental Analysis

Elemental Analysis

Elemental Analysis and Trace metals detection are essential in many industries. Particularly in food and pharmaceutical products before they are certified for commercial use. Our equipment like µXRF, SEM EDAX, coupled with our testing laboratory can offer best support for Elemental Analysis studies for this purpose. 

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  • Quick view

    Olympus Handheld XRF Analyzer — Delta Classic Plus

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    The DELTA Classic Plus with a 40kV tube and Si-PIN detector is ideal for simple applications. The DELTA Classic Plus provides quick ID, screening, sorting, and elemental and metals analysis. The DELTA Classic Plus is a proven, ruggedized analyzer, that is cost-effective, easy to use, and reliable.

    ScrapMetals_DELTA__classic

    • Powerful 4W X-ray tube, 200 µA current (max), optimized beam settings
    • Tight geometry for exceptional LODs and high analysis throughput
    • Large-Area SDD and customized X-ray tube options for sensitivity materials
    • Integrated Bluetooth® for data input and output available in most countries
    • Lightning-fast data acquisition for faster testing time
    • Advanced colortouch LCD screen for clarity, brightness, responsiveness, and energy efficiency for indoor / outdoor use
    • Accelerometer technology puts the unit into sleep mode to save energy when not in use; logs impacts for tool managemen
    • USB interface port for high-speed downloads and seamless PC control
    • Ergonomic rubberized handle for enhanced grip
    • Docking Station and Hot Swap Batteries
    • Hot Swap batteries to maximize uptime and productivity 

    This instrument is great in identify the presence of lead paint on multiple surfaces prior to repair, restoration or painting. It provides a fast and accurate method of measuring Pb concentrations in a multilayer coating without the liabilities of radioactive isotopes. The software-based proximity sensor enables easy measurements on uneven surfaces. With no radioactive sources, the analyzer eliminates isotope loss of speed and high replacement costs.

    ScrapMetals_DELTA__classic_Pb_in_paint

     


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    Olympus Handheld XRF Analyzer — Delta Professional

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    The DELTA Professional provides excellent performance in speed, LODs, and elemental range. It is housed in an industrial designed body ruggedized to demanding environments. It provides the best mix of durability and analytical performance with lower cost of ownership. The DELTA Professional Incorporates everything you need in a handheld XRF with state-of-the-art innovations and a rugged design

    Olympus_handheld_XRF_Delta_Professional_analysis

    DELTA Consumer Safety & RoHS Handheld XRF Analyzers allow for testing large quantities of consumer & electronic products anywhere, anytime. Get simple, fast, nondestructive regulatory compliance screening for Pb, Cd, Hg, Br & more. Use for ASTM Method F2617-08, HR4040, CPSC, CPSIA etc.


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    Olympus Handheld XRF Analyzer — VANTA

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    Vanta is the most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field. It built to be tough, rugged and tested:

    • Drop tested using U.S. Department of Defense methods (MIL-STD-810G), reducing the risk of damage and costly repairs when a device is dropped or jostled.
    • IP65 rated dust and water resistant to protect against the hazards found in even the most challenging environments.*
    • Withstands a temperature range of -10 °C to 50 °C (14 °F to 122 °F) at full duty cycle, so you waste less time waiting for your analyzer to cool.**
    • The detector shutter on C and M series models helps prevent punctures so you can analyze rough surfaces with confidence.

     

    Olympus_handheld_XRF_Vanta_analysis

    Software Speciality

    • SmartSort: automatically lengthens or shortens test time based on material to save time; obtain aluminum grade results in as little as 1 second.
    • Grade match messaging: real time and/or pop-up messages with familiar trade or grade names or special handling instructions to reduce user training and increase efficiency.
    • Nominal value: automatically identifies the likely presence of elements invisible to XRF based on grade specifications.
    • Residual library: set a maximum tolerated concentration for residual elements in grade families.
    • On-screen grade comparison: compare close grades side-by-side to know which alloy is the best match with nominal and residual values.

     


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    Olympus Portable Bench-top XRD Analyzer — TERRA

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    The TERRA Portable Bench-top XRD Analyser is a high performing, completely contained, battery operated, closed-beam system.  It provides full phase ID of major, minor and trace components with a qualitative XRF scan of elements Ca - U. The unit offers minimal sample preparation and sample chamber allow for fast, in-field analysis. With rugged design and long battery-life, it is especially suitable for field work, mining activities, corrosion investigation etc.

    Using a specifically developed direct excitation charge coupled device (CCD) “camera”, TERRA is able to collect X-ray photon data for both X-ray diffraction and X-ray fluorescence simultaneously. This is the result of the integrated camera’s ability to detect both photon position and photon energy at the same time. With energy resolution of ~200 eV (5.9 keV), TERRA makes XRF analysis as simple as viewing the software spectrum display.

    Olympus_portable_XRD_Terra

     

     

    Terra XRD sample vibration chamber needs only 10~15 mg sample. The vibration chamber’s convection process presents the instrument optics with multifarious orientations of the crystalline structure. This results in a superb X-ray diffraction pattern, virtually free of the problematic preferred-orientation effects encountered when using classic preparation methods.

    Due to its unique powder-handling system, nonmechanical goniometers, and lack of complicated moving parts, TERRA is extremely well suited for those applications where field portability and/or ease of use is at issue.

    Olympus_portable_XRD_Terra_sample


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  • Bruker M1 MISTRAL Micro-XRF SpectrometerQuick view

    Bruker M1 MISTRAL Micro-XRF Spectrometer

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    The M1 MISTRAL is a compact tabletop Micro-XRF spectrometer for the analysis of bulk materials and coatings. Designed for fast and cost-efficient operation it provides accurate information on the elemental composition of materials. The instrument features high spatial resolution and spot sizes down to 100 µm. Arbitrarily shaped samples, like the most intricate pieces of jewelry, can be analyzed without further preparation, and nondestructively. Sample sizes of up to 100x100x100 mm³ are supported. A video microscope with cross hair-functionality facilitates exact pinpointing of the desired measurement location. The motorized Z-stage allows fast focusing. The optionally available X-Y-Z stage provides even greater ease of use. The M1 MISTRAL is equipped with a high brightness micro-focus X-ray tube that ensures excellent excitation of the measurement spot resulting in a high fluorescence yield. With its powerful, yet easy-to-use, XSpect software suite, the instrument delivers accurate quantification results, no matter whether analyzing bulk materials or the most complicated multi-layer structures.


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  • Bruker XRF M2Quick view

    Bruker M2 BLIZZARD Slotted Micro-XRF Spectrometer

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    This small-spot X-ray fluorescence (XRF) spectrometer is specifically designed for the non-destructive testing and analysis (NDT) of printed circuit boards (PCB) in accordance with ASTM B568 and DIN/ISO 3497 standards. The slotted sample chamber and the large tray support fast and exact positioning of all types of PCBs from small to oversized that extend the sample chamber. Its rugged construction allows the M2 BLIZZARD to be used on the shop floor.

    The 2016 revamped M2 BLIZZARD is equipped with a high-performance silicon drift detector which is suitable for the analysis of thinner layers and unknowns as well as for routine analysis. The powerful video microscope system provides an auto focus function. Ease-of-use is further enhanced by software support of an optional industrial-strength foot switch and touchscreen operation.
    Equipped with the latest version of Bruker’s XSpect Pro and XData software packages, the M2 BLIZZARD is particularly attractive for the analysis of metal multilayers that are common to PCBs. Layer systems consisting of up to 12 layers with up to 25 elements each can be characterized with regard to composition and thickness.

    Experienced supervisors can use the configurability of the software to define measurement methods fine-tuned to the samples to be analyzed. These methods can then be routinely used by staff at the production site to perform the actual analyses for quality control. Setting up and performing these analyses is intuitive so that introductory training of staff is sufficient. The PASS/FAIL determination of the software or trend line display with upper and lower control limits lets the operator see immediately whether a sample is of acceptable quality or not. Reporting and data archiving functions are included as well and data can be exported to Excel®.


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  • Bruker M4 TORNADO Micro-XRF SpectrometerQuick view

    Bruker M4 TORNADO Micro-XRF Spectrometer

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    M4 TORNADO is the tool of choice for sample characterization using small-spot Micro X-ray Fluorescence (Micro-XRF) for information on composition and element distribution. Optimized for analysis speed and without compromising accuracy it measures a wide range of samples. Whether small or large, even or irregularly shaped — equipped with a large high-speed stage it supports 2D, non-destructive testing and analysis (NDT) of virtually any kind of inorganic, organic, and even of liquid sample. Its large vacuum chamber enables light element detection.

    M4 TORNADO now features an optional 60 mm2 XFlash® SD detector for ultra high-speed spectra acquisition with up to 50 percent higher element sensitivity, compared to the standard 30 mm² active detector area, and significantly improves the measurement efficiency when using primary filters or analyzing light element samples.  This new option is ideally suited for geology and other low yield applications, the analysis of thin samples, and low kV or tube current conditions. The 60 mm² XFlash® SDD is also available as a dual detector system which doubles sensitivity and throughput.

    The M4 TORNADO analysis software 1.3 provides a flexible measurement setup and a variety of evaluation and processing tools. The new X Method module makes it easy to manage calibrations and standards and enables the user to develop and optimize analytical methods for complex applications, such as quantitative analysis of metallic multilayer stacks for composition and coating thickness.


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  • Bruker M6 JETSTREAM Portable Micro-XRF SpectrometerQuick view

    Bruker M6 JETSTREAM Portable Micro-XRF Spectrometer

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    The Bruker M6 JETSTREAM is designed for the non-destructive testing and analysis (NDT) of large samples, Eg. Large paintings or bulky artefacts. The mobility of the instrument allows it to be placed at the site of the object of interest, be it in a gallery, museum or on the shop floor. The performance parameters enable scanning areas of 800 mm x 600 mm with a variable spot size down to 100 µm and speeds of up to 100 mm/s. As the system is capable of measurement "on-the-fly" this results in a pixel dwell time of as short as 1 ms. Measurement rig can be tilted, allowing samples to be scanned either horizontally or vertically. The spot size of the M6 JETSTREAM can be adapted in five steps to match the structure of the sample and the desired spatial resolution. Bruker's advanced XFlash® silicon drift detectors (SDD) are used for the detection of fluorescence radiation. They feature high count rate capability and best energy resolution over a wide count rate range. Special safety circuitry provides optimal user protection against exposure to X-rays Ultrasound distance measurement safeguards against collision with the measurement object. Regardless of sample size, the M6 JETSTREAM can be easily positioned due to its mobility. It can be disassembled into four parts which makes it transportable.


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    Bruker Quantax EBSD

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    Based on SEM, Bruker's QUANTAX EBSD measures the local crystal orientation with sub-micron spatial resolution. It can be used for phase distribution analysis which reveals presence of hard and brittle inter-metallic phases sigma and chi. It can also be used for orientation distribution mapping which allows visualization of the strain accumulated at the boundary between the ferrite and sigma phase grain. The system can also be used in conjunction with the QUANTAX EDS system creating the most advanced integrated EBSD/EDS system, supported by the ESPRIT 2 software under a single user interface.


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    Horiba EMAX X-ray Detector (EDS)

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    Liquid nitrogen free X-ray Detector

    EMAX x-act can achieve good energy resolution of an unprecedented level in light element using a unique silicon drift sensor (SDD). Its combination with the digital pulse processor assures accurate results under all conditions.

    • LN2 free detector - Quick start up
    • Quick analysis - Decreasing mapping time by high counting rate performance
    • High operational stability - Stable performance up to high counting ranges in both qualitative and quantitative analysis
    • All EMAX software functions are available - Navigator, Help function, Quantitative map and so on.

     

    Example EDS SEM of EMAX x-act

    horiba 1


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  • Atomic Emission Spectrometers OES Hydrogen analyzersQuick view

    MPA ZENITH Arc Spark Optical Emission Spectrometer

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    Designed to meet the highest and most stringent standards of performance, reliability and repeatability, the Metavision X-Series, with its innovative multi-optics system, extended wavelength range and plethora of analytical features, assures the entire gamut of analytical features and analyses of the widest range of elements right down to trace levels.
    The X-Series spectrometers have been designed specifically for those that require the highest level of accuracy and precision at extremely low limits of detection. Capable of analyzing just about every element possible and with low-PPM and sub-PPM limits of detection for each, the X-Series spectrometers are ideal for a wide range of users. Being CCD-based, there is never any need for hardware upgrades, even if new elements, bases or matrices are to be added post-purchase, with additions being simple and possible to do even on-site!

    • Time-resolved spectroscopy
    • Single SUS standardization
    • Soluble-insoluble analysis
    • 50+ elements; including low N, O, C
    • Full 120-800 nm range
    • Multi-CCD optics
    • Trace analysis (PPM / sub-PPM)

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  • Atomic Emission Spectrometers OES Hydrogen analyzersQuick view

    MPA Metavision-108N Arc Spark Optical Emission Spectrometer

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    The CCD based Metavision-108N series spectrometers are compact, consume less energy and argon, are more economical to operate and maintain and deliver precision and accuracy of the highest order. Using high-resolution CCD detectors, the Metavision-108N series analyses the entire spectrum in the wavelength range of 160 to 780 nm, delivering the capability to analyze the entire gamut of critical elements, including Nitrogen, Sodium, Potassium and Lithium.
    The Metavision-108N is an extremely powerful and yet highly flexible instrument with an analytical capability of more than 10 bases and 20+ elements. Aside from routine applications to analyze pure metals and alloys, there is also a range of proven special applications – including thin foils, special tool steel, wires, rings, coins, pig iron and several more. We also develop custom applications on demand to meet specific customer requirements.


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  • Atomic Emission Spectrometers OES Hydrogen analyzersQuick view

    MPA Metavision-1008i Arc Spark Optical Emission Spectrometer

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    The Metavision-1008i has been created for rapid analysis (20 seconds for non-ferrous metals and 25 seconds for steels & cast iron). It offers low detection limits combined with high stability, precision and accuracy. At the same time, it is rugged, reliable and requires minimal operating and maintenance overhead.
    Proven capabilities across Lead analysis, Cast Iron / S.G. Iron / Ductile / Malleable Iron (including analysis of Zinc) Stainless Steels (including Nitrogen in Duplex and other Steels), Heat-resistant Stainless Steels and analysis of low levels of Carbon, make the Metavision-1008i a powerful Laboratory-grade solution to almost every requirement in metals industries.


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  • Atomic Emission Spectrometers OES Hydrogen analyzersQuick view

    MPA Metavision-108P Portable Arc Spark Optical Emission Spectrometer

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    Several metal applications – most particularly in recycling and scrap, and also frequently in routine metal processing or incoming / outgoing QC – require a spectrometer to be mobile and call for a probe as opposed to the standard sample stands that feature on stationary spectrometers.
    Built with such applications in mind, the Metavision-108P is a mobile spectrometer equipped with a hand-held probe. The Metavision-108P is built to be rugged enough to withstand shopfloor stresses and provide fatigue-free operations across a range of environmental and working conditions.
    Light and ergonomic, the probe is designed for ease-of-use and operating convenience, while the instrument’s battery increases mobility and allows for sustained usage even in places without power supply sources.

    Metal Power Slide


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  • Atomic Emission Spectrometers OES Hydrogen analyzersQuick view

    MPA Spartan Arc Spark Optical Emission Spectrometer

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    The Spartan shares its DNA with the Metavision-108N series and has been custom-designed by Metal Power to address the needs of the SMEs – which has often been forced to shy away from investments in spectrometers purely on account of the capital costs involved. With high precision, accuracy and repeatability, the Spartan is a rugged and compact benchtop solution that meets all the critical quality assurance needs of fast-growing and quality-conscious SMEs.
    Available for ferrous and non-ferrous (Al, Cu etc) bases, the Spartan is powered with the same Analyst operating and applications suite that powers the Metavision-108N series. Designed for usage even by untrained operators, the Spartan is not just easy-to-use, but also easy to maintain, while its low Argon and electricity consumption ensure that operating costs do not offset its low cost of acquisition, making it the instrument with the lowest total cost of ownership in the world.


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  • Bruker QUANTAX Micro-XRFQuick view

    Bruker QUANTAX Micro-XRF (XTrace on SEM)

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    QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF spectrometer to a scanning electron microscope. XTrace fits on a free inclined chamber port of almost any SEM. The user benefits from both the trace element sensitivity and the higher information depth of XRF analysis. A complete micro-XRF spectrometer without the investment
    • Distribution analysis with HyperMap stores complete spectra for every map point for on- and offline analysis
    • Samples can be analyzed with Micro-XRF and EDS without position change
    • Both methods are integrated in the same analytical software suite - ESPRIT 2.0
    • No interference with normal SEM operation, XTrace can stay in its measurement position most of the time.
    • Analytical results compare to those of standalone systems
    • Image tiling allows mapping large areas
    • Selectable primary radiation filters to suppress diffraction peaks
    • Uses the SEM motorized stage
    • Allows sample tilt to produce minimum spot sizes.


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  • Bruker VERTEX 80 Series FTIR SpectrometerQuick view

    Bruker VERTEX 80 Series FTIR Spectrometer

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    The VERTEX 80 series Fourier Transform Infrared Spectroscopy FTIR spectrometers are based on the actively aligned UltraScan™ interferometer, which provides PEAK spectral resolution. The precise linear air bearing scanner and PEAK quality optics guarantees the ultimate sensitivity and stability. The VERTEX 80v is an evacuated optics bench that can eliminate atmospheric moisture absorptions for ultimate sensitivity and stability; enabling demanding experiments such as high resolution, ultra fast rapidscan, step-scan, or UV spectral range measurements. The VERTEX 80/80v optics design allows PEAK flexibility and at the same time PEAK instrument performance. The unique Bruker Optics DigiTect™ technology prevents external signal disturbance, guarantees PEAK signal-to-noise ratio and allows easy and reproducible detector exchange by the instrument user.


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  • Bruker VERTEX 70 Series FTIR SpectrometerQuick view

    Bruker VERTEX 70 Series FTIR Spectrometer

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    VERTEX 70 series offer unmatched performance and versatility for demanding analytical and research applications in Fourier Transform Infrared Spectroscopy FTIR. Its innovative design results in the highest flexibility and highest performance. The data acquisition is based on two channel delta sigma ADCs with 24-bit dynamic range, which are running in parallel and integrated into the detector pre-amplifier electronics. This advanced DigiTect technology prevents external signal disturbance and guarantees the highest signal-to-noise ratio. The new VERTEX FM functionality provides the unique possibility to acquire a complete far and mid IR spectrum from 6000 cm-1 to 80 cm-1 (or to 50 cm-1 with the VERTEX 70v vacuum optics bench) in a single step measurement.


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  • Bruker TENSOR II FTIR SpectrometerQuick view

    Bruker TENSOR II FTIR Spectrometer

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    TENSOR II is a high performing Fourier Transform Infrared Spectroscopy FTIR spectrometer with a compact size. It combines the highest sensitivity and outstanding flexibility, with an intuitive and easy to operate interface. These features make TENSOR II the best choice for advanced applications in industrial R&D and academia. TENSOR II has been designed to extend the strength of the well-established TENSOR series by innovation. As the first spectrometer in its class TENSOR II utilizes a modern diode laser. Furthermore TENSOR II provides a new electronic stabilization function for the IR source. These features greatly increase the life time of the two major wear parts in IR spectrometers and further reduce your maintenance costs and efforts.


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  • Bruker LUMOS FTIR MicroscopeQuick view

    Bruker LUMOS FTIR Microscope

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    The LUMOS is a fully automatic standalone Fourier Transform Infrared Spectroscopy FTIR microscope:
    • Highly comfortable and easy in use
    • Motorized ATR crystal (ATR = Attenuated total reflection)
    • Fully automated measurement in transmission, reflection and ATR mode
    • Large working distance; allowing ample space for sampling
    • Outperforming quality in both IR and VIS range
    • Space saving footprint


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